Inventor

Seiji Kashioka

Inventor
Hachioji, JP

Overview

24→
Patents
1977–2012
Patent span
Physics
Primary field (CPC G)

Patents· 24 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G06Vprimary
G06VImage or video recognition or understanding25%
G06TImage data processing or generation, in general20%
G01BMeasuring length, thickness or similar linear dimensions8%
G06FElectric digital data processing8%
H04NPictorial communication, e.g. television8%
H03KPulse technique5%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
G04FTime-interval measuring3%
G07CTime or attendance registers3%
G09BEducational or demonstration appliances3%
PatentTitleYear
8,278,542'Metronome responding to moving tempo'20127,888,568'Timpani with quick, accurate and programmable tuning system'20117,649,134'Method for displaying music score by using computer'20105,568,524'Filter device comprising a recursive filter unit, method of filtering, and transmission system comprising such a filter device'19965,321,423'Document information system and document data transfer and display method'19945,293,433'Method and device for detecting patterns adapted automatically for the level of noise'19945,278,946'Method of presenting multimedia data in a desired form by comparing and replacing a user template model with analogous portions of a system'19945,193,127'Method and device for detecting patterns adapted automatically for the level of noise'19934,992,955'Apparatus for representing continuous tone and high contrast images on a bilevel display'19914,783,831'Method for producing a standard pattern for pattern matching'19884,665,556'Image signal processor'19874,494,139'Automatic assembly system'19854,491,962'Method of determining an optimum threshold for obtaining binary image signal for use in a pattern recognition system'19854,484,347'Method of image transformation in a display device'19844,435,835'Method and device for detecting the position of an object'19844,345,312'Method and device for inspecting the defect of a pattern represented on an article'19824,334,241'Pattern position detecting system'19824,291,334'System for detecting the position of an object'19814,288,816'Compressed image producing system'19814,109,211'Variable thresholding circuit for converting an analog signal to a binary signal'19784,091,394'Pattern position detecting system'19784,064,484'Analog-digital converter with variable threshold levels'19774,057,845'Group control system for visual information processing'19774,044,311'Feature extraction system for extracting a predetermined feature from a signal'1977

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1977–1994Patents assigned to HITACHI LTD (19)· patent assignee history
1977–1978Based in Kokubunji, JP· patent location history
1978–1994Based in Hachioji, JP· patent location history
1982–1984Based in Hachiouji, JP· patent location history
1991Patents assigned to HITZCHI LTD (1)· patent assignee history
1993–1996Patents assigned to PHILIPS CORP (3)· patent assignee history
1993–1994Based in Tokyo, JP· patent location history
2010–2012Patents assigned to KASHIOKA SEIJI (3)· patent assignee history
2010–2012Based in Walnut, CA, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI LTD191977–1994
KASHIOKA SEIJIself32010–2012
PHILIPS CORP31993–1996
HITZCHI LTD11991
Locations
LocationPatentsSpan
Hachioji, JP111978–1994
Kokubunji, JP41977–1978
Walnut, California, US32010–2012
Hachiouji, JP31982–1984
Tokyo, JP21993–1994