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Inventor

Yuichi Tazuke

Inventor
Hitachi, JP

Overview

2→
Patents
2000
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Qprimary
G01QScanning-probe techniques or apparatus29%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests29%
G01BMeasuring length, thickness or similar linear dimensions14%
G01NInvestigating or analysing materials by determining their chemical or physical properties14%
H01FMagnets14%
PatentTitleYear
6,081,115'Method of measuring exchange force and method of evaluating magnetism using the exchange force'20006,078,174'Apparatus for measuring exchange force'2000

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2000Patents assigned to UNIV HOKKAIDO (2)· patent assignee history
2000Based in Hitachi, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
UNIV HOKKAIDO22000
Locations
LocationPatentsSpan
Hitachi, JP22000