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Inventor

Jan Liesener

Inventor
Middletown, CT, US

Overview

19→
Patents
2010–2018
Patent span
Physics
Primary field (CPC G)

Patents· 19 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions38%
Y10TTechnical subjects covered by former us classification16%
G01DMeasuring not specially adapted for a specific variable14%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices14%
G01NInvestigating or analysing materials by determining their chemical or physical properties5%
G01MTesting static or dynamic balance of machines or structures3%
G02BOptical elements, systems or apparatus3%
H01LSemiconductor devices3%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h103%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h103%
PatentTitleYear
10,066,974Interferometric encoder systems having at least partially overlapping diffracted beams20189,891,078'Interferometric encoders using spectral analysis'20189,798,130'Measuring topography of aspheric and other non-flat surfaces'20179,746,348'Double pass interferometric encoder system'20179,719,777'Interferometer with real-time fringe-free imaging'20179,201,313'Compact encoder head for interferometric encoder system'20159,115,975'Position monitoring system with reduced noise'20159,025,161'Double pass interferometric encoder system'20158,941,842'Double pass interferometric encoder system'20158,902,431'Low coherence interferometry with scan error correction'20148,854,628'Interferometric methods for metrology of surfaces, films and underresolved structures'20148,456,644'Measurement of changes in surfaces of objects'20138,379,218'Fiber-based interferometer system for monitoring an imaging interferometer'20138,248,617'Interferometer for overlay measurements'20128,189,202'Interferometer for determining overlay errors'20128,120,781'Interferometric systems and methods featuring spectral analysis of unevenly sampled data'20128,004,688'Scan error correction in low coherence scanning interferometry'20117,978,338'Compound reference interferometer'20117,751,064'Interference objective for annular test surfaces'2010

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2010–2018Patents assigned to ZYGO CORP (18)· patent assignee history
2010–2018Based in Middletown, CT, US· patent location history
2012–2014Patents assigned to LIESENER JAN (6)· patent assignee history
2012–2013Patents assigned to DE GROOT PETER (3)· patent assignee history
2012–2013Patents assigned to DE LEGA XAVIER COLONNA (3)· patent assignee history
2012–2013Patents assigned to DAVIDSON MARK (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
ZYGO CORP182010–2018
LIESENER JANself62012–2014
DE GROOT PETER32012–2013
DE LEGA XAVIER COLONNA32012–2013
DAVIDSON MARK22012–2013
Locations
LocationPatentsSpan
Middletown, CT, US192010–2018