Inventor
Florian Schamberger
Inventor
Bad Reichenhall, DE
Overview
Patents· 34 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores49%
G01RMeasuring electric variables11%
G06FElectric digital data processing9%
H10DInorganic electric semiconductor devices9%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h109%
H03KPulse technique4%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h104%
H01CResistors2%
H01RElectrically-conductive connections2%
H05KPrinted circuits2%
PatentTitleYear
7,808,272'Integrated circuit'20107,427,202'Means of mounting for electronic components, arrangement and procedure'20087,296,198'Method for testing semiconductor memory modules'20077,222,271'Method for repairing hardware faults in memory chips'20077,181,643'Method for comparing the address of a memory access with an already known address of a faulty memory cell'20077,054,180'Method and circuit for adjusting a resistance in an integrated circuit'20067,047,454'Integrated circuit having a data processing unit and a buffer memory'20066,919,234'Method for producing an antifuse in a substrate and an antifuse structure for integration in a substrate'20056,868,028'Circuit configuration for driving a programmable link'20056,856,186'Circuit configuration for level boosting, in particular for driving a programmable link'20056,807,123'Circuit configuration for driving a programmable link'20046,804,166'Method and apparatus for operating a semiconductor memory at double data transfer rate'20046,800,817'Semiconductor component for connection to a test system'20046,788,129'Integrated circuit having a programmable element and method of operating the circuit'20046,768,695'Circuit configuration for driving a programmable link'20046,728,902'Integrated circuit having a self-test device for carrying out a self-test of the integrated circuit'20046,717,437'Semiconductor module'20046,717,200'Vertical field effect transistor with internal annular gate and method of production'20046,715,118'Configuration for generating signal impulses of defined lengths in a module with a bist-function'20046,675,322'Integrated circuit having a self-test device'20046,557,130'Configuration and method for storing the test results obtained by a BIST circuit'20036,535,046'Integrated semiconductor circuit with an increased operating voltage'20036,449,206'Semiconductor circuit configuration'20026,441,677'Integrated semiconductor circuit with an increased operating voltage'20026,418,069'Method of repairing defective memory cells of an integrated memory'20026,415,406'Integrated circuit having a self-test device and method for producing the integrated circuit'20026,366,518'Circuit configuration for programming an electrically programmable element'20026,344,757'Circuit configuration for programming an electrically programmable element'20026,320,368'Method for determining the drive capability of a driver circuit of an integrated circuit'20016,313,656'Method of testing leakage current at a contact-making point in an integrated circuit by determining a potential at the contact-making point'20016,292,414'Method for repairing defective memory cells of an integrated semiconductor memory'20016,288,939'Circuit configuration for monitoring states of a memory device'20016,229,206'Bonding pad test configuration'20016,178,124'Integrated memory having a self-repair function'2001Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001–2008Patents assigned to INFINEON TECHNOLOGIES AG (24)· patent assignee history
2001–2004Patents assigned to SIEMENS AG (8)· patent assignee history
2001Patents assigned to INFINEON TECHNOLOGIES (1)· patent assignee history
2001–2010Based in Bad Reichenhall, DE· patent location history
2005–2007Based in München, DE· patent location history
2010Patents assigned to QIMONDA AG (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| INFINEON TECHNOLOGIES AG | 24 | 2001–2008 |
| SIEMENS AG | 8 | 2001–2004 |
| INFINEON TECHNOLOGIES | 1 | 2001 |
| QIMONDA AG | 1 | 2010 |
Locations
| Location | Patents | Span |
|---|---|---|
| Bad Reichenhall, DE | 31 | 2001–2010 |
| München, DE | 3 | 2005–2007 |