Inventor

Robert J. Chong

Inventor

Austin, TX, US

Overview

18→

Patents

2003–2013

Patent span

Physics

Primary field (CPC G)

Patents· 18 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G05Bprimary

G05BControl or regulating systems in general34%

Y02PClimate change mitigation technologies in the production or processing of goods25%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1016%

C23CCoating metallic material3%

G01NInvestigating or analysing materials by determining their chemical or physical properties3%

G01RMeasuring electric variables3%

G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices3%

G06FElectric digital data processing3%

H01JElectric discharge tubes or discharge lamps3%

H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h103%

PatentTitleYear

8,359,494'Parallel fault detection'2013 7,774,670'Method and apparatus for dynamically determining tester recipes'2010 7,473,566'Method and apparatus for controlling a film formation process with multiple objectives'2009 7,424,392'Applying a self-adaptive filter to a drifting process'2008 7,186,487'Method of controlling exposure processes by monitoring photon levels, and system for accomplishing same'2007 7,117,062'Determining transmission of error effects for improving parametric performance'2006 7,100,081'Method and apparatus for fault classification based on residual vectors'2006 7,020,535'Method and apparatus for providing excitation for a process controller'2006 6,961,636'Method and apparatus for dynamically monitoring controller tuning parameters'2005 6,953,697'Advanced process control of the manufacture of an oxide-nitride-oxide stack of a memory device, and system for accomplishing same'2005 6,912,433'Determining a next tool state based on fault detection information'2005 6,912,437'Method and apparatus for controlling a fabrication process based on a measured electrical characteristic'2005 6,907,369'Method and apparatus for modifying design constraints based on observed performance'2005 6,871,114'Updating process controller based upon fault detection analysis'2005 6,842,661'Process control at an interconnect level'2005 6,804,619'Process control based on tool health data'2004 6,790,376'Process control based upon weight or mass measurements, and systems for accomplishing same'2004 6,554,969'Acoustically enhanced deposition processes, and systems for performing same'2003

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2003–2009Patents assigned to ADVANCED MICRO DEVICES INC (14)· patent assignee history

2003–2013Based in Austin, TX, US· patent location history

2005Patents assigned to ADVANCED MIRCO DEVICES INC (1)· patent assignee history

2010–2013Patents assigned to GLOBALFOUNDRIES INC (2)· patent assignee history

2013Patents assigned to ADAMS III ERNEST D (1)· patent assignee history

2013Patents assigned to CASTLE HOWARD E (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
ADVANCED MICRO DEVICES INC	14	2003–2009
GLOBALFOUNDRIES INC	2	2010–2013
ADAMS III ERNEST D	1	2013
ADVANCED MIRCO DEVICES INC	1	2005
CASTLE HOWARD E	1	2013

Locations

Location	Patents	Span
Austin, Texas, US	18	2003–2013