Inventor
Takayuki Hayashizaki
Inventor
Aomori, JP
Overview
Patents· 15 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables58%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1017%
Y10TTechnical subjects covered by former us classification17%
C23FNon-mechanical removal of metallic material from surface4%
H01RElectrically-conductive connections4%
PatentTitleYear
10,859,599Electrical connection apparatus202010,768,207Electrical connection device20209,435,854'Electrical contactor and contact method for the same'20168,975,908'Electrical test probe and probe assembly with improved probe tip'20158,063,651'Contact for electrical test of electronic devices, probe assembly and method for manufacturing the same'20117,888,958'Current test probe having a solder guide portion, and related probe assembly and production method'20117,862,733'Method for manufacturing a probe'20117,816,931'Contact for electrical test, electrical connecting apparatus using it, and method of producing the contact'20107,736,690'Method for manufacturing an electrical test probe'20107,721,429'Method for manufacturing a probe'20107,679,389'Probe for electrical test and electrical connecting apparatus using it'20107,629,807'Electrical test probe'20097,586,321'Electrical test probe and electrical test probe assembly'20097,557,593'Probe for electrical test and probe assembly'20097,523,539'Method of manufacturing a probe'2009Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2009–2020Patents assigned to NIHON MICRONICS KK (15)· patent assignee history
2009–2020Based in Aomori, JP· patent location history
2009–2011Based in Hirakawa, JP· patent location history
2011–2015Patents assigned to HAYASHIZAKI TAKAYUKI (2)· patent assignee history
2011Patents assigned to KAMATA SHOJI (1)· patent assignee history
2011Patents assigned to SATO TOMOYA (1)· patent assignee history
2015Patents assigned to HIRAKAWA HIDEKI (1)· patent assignee history
2016Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NIHON MICRONICS KK | 15 | 2009–2020 |
| HAYASHIZAKI TAKAYUKIself | 2 | 2011–2015 |
| HIRAKAWA HIDEKI | 1 | 2015 |
| KAMATA SHOJI | 1 | 2011 |
| SATO TOMOYA | 1 | 2011 |
Locations
| Location | Patents | Span |
|---|---|---|
| Aomori, JP | 11 | 2009–2020 |
| Hirakawa, JP | 3 | 2009–2011 |
| Tokyo, JP | 1 | 2016 |