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Inventor

Muneaki Tamura

Inventor
Yamanashi, JP

Overview

2→
Patents
2018–2019
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables50%
G01BMeasuring length, thickness or similar linear dimensions25%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1025%
PatentTitleYear
10,310,010Probe apparatus and probe method201910,006,941Position accuracy inspecting method, position accuracy inspecting apparatus, and position inspecting unit2018

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2018–2019Patents assigned to TOKYO ELECTRON LTD (2)· patent assignee history
2018Based in Nirasaki, JP· patent location history
2019Patents assigned to SEIWA OPTICAL CO LTD (1)· patent assignee history
2019Based in Yamanashi, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TOKYO ELECTRON LTD22018–2019
SEIWA OPTICAL CO LTD12019
Locations
LocationPatentsSpan
Yamanashi, JP12019
Nirasaki, JP12018