Inventor
Tetsuya Kuwashima
Inventor
Tokyo, JP
Overview
Patents· 22 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Bprimary
G11BInformation storage based on relative movement between record carrier and transducer36%
B82YSpecific uses or applications of nanostructures31%
Y10TTechnical subjects covered by former us classification11%
G01RMeasuring electric variables7%
H10NElectric solid-state devices not otherwise provided for5%
G01PMeasuring linear or angular speed, acceleration, deceleration, or shock4%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure2%
G01QScanning-probe techniques or apparatus2%
H01FMagnets2%
PatentTitleYear
8,240,026'Method of manufacturing a magneto-resistive device'20128,125,743'Thin-film magnetic head, magnetic head assembly, magnetic disk drive apparatus and method for manufacturing thin-film magnetic head'20127,978,438'Thin-film magnetic head with shield layer profile having obtuse or rounded corners, magnetic head assembly, magnetic disk drive apparatus and manufacturing method of thin-film magnetic head'20117,933,099'Thin-film magnetic head having electric lapping guide and method of making the same'20117,916,434'Tunnel magnetoresistive effect element with limited electric popping output voltage'20117,911,745'Thin-film magnetic head comprising a magneto-resistive effect device of the CPP structure including a re-magnetizing bias layer and magnetic disk system'20117,894,168'Thin-film magnetic head comprising a magneto-resistive effect device of a CPP structure and having a shunting layer'20117,784,171'Method of manufacturing a magneto-resistive device'20107,743,666'Tunneling effect element and physical quantity to electrical quantity transducer'20107,672,084'Composite thin-film magnetic head with non-magnetic conductive layer electrically connected with lower pole layer to increase counter electrode area'20107,672,087'Magnetoresistive effect element having bias layer with internal stress controlled'20107,583,462'Head amplifier with a heat controller'20097,542,245'Composite thin-film magnetic head with non-magnetic conductive layer to balance parasitic capacitances'20097,520,165'Micro structure, cantilever, scanning probe microscope and a method of measuring deformation quantity for the fine structure'20097,436,633'Thin-film magnetic head, head gimbal assembly and hard disk system'20087,312,961'Magnetic head and method of manufacturing same, head suspension assembly and magnetic disk apparatus'20077,308,751'Magnetic head and method of manufacturing same, head suspension assembly and magnetic disk apparatus'20077,253,994'Magnetic head, head suspension assembly and magnetic disk apparatus'20077,192,676'Magneto-resistance effect element bar exposure method'20077,057,859'Magneto-resistive device with reduced susceptibility to ion beam damage'20066,700,740'Thin-film magnetic head and method of manufacturing same'20046,669,983'Manufacturing method of thin-film magnetic head with magnetoresistive effect element'2003Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2003–2012Patents assigned to TDK CORP (22)· patent assignee history
2003–2012Based in Tokyo, JP· patent location history
2007–2010Based in Chuo-ku, JP· patent location history
2012Patents assigned to KUWASHIMA TETSUYA (2)· patent assignee history
2012Patents assigned to KAGAMI TAKEO (1)· patent assignee history
2012Patents assigned to KANAYA TAKAYASU (1)· patent assignee history
2012Patents assigned to OHTA NAOKI (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TDK CORP | 22 | 2003–2012 |
| KUWASHIMA TETSUYAself | 2 | 2012 |
| KAGAMI TAKEO | 1 | 2012 |
| KANAYA TAKAYASU | 1 | 2012 |
| OHTA NAOKI | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 18 | 2003–2012 |
| Chuo-ku, JP | 4 | 2007–2010 |