Inventor
XUEDONG LIU
Inventor
US
Overview
Patents· 49 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps69%
G01NInvestigating or analysing materials by determining their chemical or physical properties10%
A61BDiagnosis3%
B82YSpecific uses or applications of nanostructures3%
G01SRadio direction-finding3%
B06BMethods or apparatus for generating or transmitting mechanical vibrations of infrasonic, sonic, or ultrasonic frequency, e.g. for performing mechanical work in general1%
B60KArrangement or mounting of propulsion units or of transmissions in vehicles1%
B60WConjoint control of vehicle sub-units of different type or different function1%
B60YIndexing scheme relating to aspects cross-cutting vehicle technology1%
C23CCoating metallic material1%
PatentTitleYear
12,578,466Linear array ultrasonic probe202612,469,668Systems and methods for compensating dispersion of a beam separator in a single-beam or multi-beam apparatus202512,463,010Multiple charged-particle beam apparatus and methods202512,424,408Apparatus of plural charged-particle beams202512,347,643Multiple charged-particle beam apparatus and methods of operating the same using movable lenses202512,278,081System and method for alignment of secondary beams in multi-beam inspection apparatus202512,243,709Apparatus using multiple charged particle beams202512,237,143Apparatus of plural charged-particle beams202512,237,144Apparatus using multiple beams of charged particles202512,211,669Multiple charged-particle beam apparatus with low crosstalk202512,196,692Systems and methods for voltage contrast defect detection202512,191,109Sample pre-charging methods and apparatuses for charged particle beam inspection202512,165,837System and method for scanning a sample using multi-beam inspection apparatus202412,142,453Multi-beam inspection apparatus202412,142,455Charged particle beam apparatus with multiple detectors and methods for imaging202412,087,541Apparatus of plural charged-particle beams202412,085,679Ultrasound beamforming method and device202412,080,515Apparatus for multiple charged-particle beams202412,033,830Multiple charged-particle beam apparatus with low crosstalk202411,961,697Apparatus using charged particle beams202411,961,698Replaceable module for a charged particle apparatus202411,948,772Methods and apparatuses for adjusting beam condition of charged particles202411,887,807Apparatus of plural charged-particle beams2024RE049784Apparatus of plural charged-particle beams202411,854,765Multiple charged-particle beam apparatus and methods202311,804,356Apparatus using multiple beams of charged particles202311,721,521Multi-beam inspection apparatus with improved detection performance of signal electrons202311,705,304Apparatus of plural charged-particle beams202311,688,580Apparatus of plural charged-particle beams202311,676,793Apparatus of plural charged particle beams202311,676,792Sample pre-charging methods and apparatuses for charged particle beam inspection202311,670,477Apparatus using charged particle beams202311,614,416System and method for aligning electron beams in multi-beam inspection apparatus202311,594,396Multi-beam inspection apparatus with single-beam mode202311,587,758Apparatus of plural charged-particle beams202311,569,060Methods and apparatuses for adjusting beam condition of charged particles202311,541,867Method and device for controlling motion of vehicle, and vehicle202311,538,655Multi-beam inspection apparatus202211,513,087Systems and methods for voltage contrast defect detection202211,469,076System and method for scanning a sample using multi-beam inspection apparatus202211,469,074Multiple charged-particle beam apparatus with low crosstalk202211,430,631Methods of inspecting samples with multiple beams of charged particles202211,398,368Apparatus of plural charged-particle beams202211,328,894Systems and methods for compensating dispersion of a beam separator in a single-beam or multi-beam apparatus202211,302,514Apparatus for multiple charged-particle beams202211,289,304Apparatus using multiple beams of charged particles202211,282,675Multi-beam inspection apparatus with improved detection performance of signal electrons202211,232,928Multi-beam inspection apparatus202211,217,423Apparatus of plural charged-particle beams2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2025Patents assigned to ASML NETHERLANDS BV (46)· patent assignee history
2022Patents assigned to HERMES MICROVISION INC (1)· patent assignee history
2022–2025Based in US· patent location history
2023Patents assigned to UNIV TSINGHUA (1)· patent assignee history
2023–2026Based in CN· patent location history
2024–2026Patents assigned to SHENZHEN MINDRAY BIOMEDICAL ELECTRONICS CO LTD (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ASML NETHERLANDS BV | 46 | 2022–2025 |
| SHENZHEN MINDRAY BIOMEDICAL ELECTRONICS CO LTD | 2 | 2024–2026 |
| HERMES MICROVISION INC | 1 | 2022 |
| UNIV TSINGHUA | 1 | 2023 |
Locations
| Location | Patents | Span |
|---|---|---|
| US | 46 | 2022–2025 |
| CN | 3 | 2023–2026 |