Inventor
Heinz Lippuner
Inventor
Rebstein, CH
Overview
Patents· 17 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Dprimary
G01DMeasuring not specially adapted for a specific variable52%
G01CMeasuring distances, levels or bearings19%
G01BMeasuring length, thickness or similar linear dimensions14%
B25JManipulators5%
H10KOrganic electric solid-state devices5%
Y10TTechnical subjects covered by former us classification5%
PatentTitleYear
9,846,063Linear encoder having calibration functionality20179,823,097'Method for determining absolute coding of an optical coding track'20179,638,550'Encoder and sensor system having plural sensors and encoder elements for determining relative positions'20179,506,753'Tilt sensor for a device and method for determining the tilt of a device'20169,341,500'Calibration method and angle measuring method for an angle measuring device, and angle measuring device'20169,080,867'Measuring method for an articulated-arm coordinate measuring machine'20158,546,745'Optoelectronic position measurement device having a guided beam path in the interior of a code carrier and optoelectronic position measurement method'20138,462,979'Optoelectronic angle sensor and method for determining a rotational angle about an axis'20138,294,906'Measuring head system for a coordinate measuring machine and method for optically measuring of displacements of a probe element'20128,242,434'Optoelectronic angle sensor for determining a rotational angle about an axis and including a code carrier having a planar self-luminous coding'20128,031,334'Method for determining an influencing variable acting on the eccentricity in a goniometer'20118,011,112'Method and apparatus for determining positions'20117,830,500'Optoelectric angle-measuring device'20107,359,047'Device for checking or calibrating the angle-dependent alignment of a high-precision test piece'20087,299,556'Method for checking or calibrating the angle-dependent alignment of a high-precision test-piece'20077,299,557'Tilt sensor'20077,199,355'Methods and apparatuses for the exact determination of an angle of rotation'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2016Patents assigned to LEICA GEOSYSTEMS AG (13)· patent assignee history
2007–2017Based in Rebstein, CH· patent location history
2012–2016Patents assigned to LIPPUNER HEINZ (7)· patent assignee history
2012–2016Patents assigned to SIERCKS KNUT (3)· patent assignee history
2016–2017Patents assigned to HEXAGON TECHNOLOGY CT GMBH (4)· patent assignee history
2016Patents assigned to AMANN WERNER (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| LEICA GEOSYSTEMS AG | 13 | 2007–2016 |
| LIPPUNER HEINZself | 7 | 2012–2016 |
| HEXAGON TECHNOLOGY CT GMBH | 4 | 2016–2017 |
| SIERCKS KNUT | 3 | 2012–2016 |
| AMANN WERNER | 1 | 2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Rebstein, CH | 17 | 2007–2017 |