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Inventor

Chih-Pen Yen

Inventor
Kaohsiung, TW

Overview

3→
Patents
2004–2008
Patent span
Physics
Primary field (CPC G)

Patents· 3 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties22%
C23CCoating metallic material11%
G01HMeasurement of mechanical vibrations or ultrasonic, sonic or infrasonic waves11%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light11%
G01SRadio direction-finding11%
G05DSystems for controlling or regulating non-electric variables11%
H01JElectric discharge tubes or discharge lamps11%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
PatentTitleYear
7,354,555'Gas flow control system with interlock'20086,815,653'Method and apparatus for early detection of material accretion and peeling in plasma system'20046,708,565'Ultrasonic wafer blade vibration detecting'2004

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2004–2008Patents assigned to TAIWAN SEMICONDUCTOR MFG (3)· patent assignee history
2004–2008Based in Kaohsiung, TW· patent location history
2004Based in Kaohusiung, TW· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TAIWAN SEMICONDUCTOR MFG32004–2008
Locations
LocationPatentsSpan
Kaohsiung, TW22004–2008
Kaohusiung, TW12004