Inventor
Jun Kuriyama
Inventor
Fukuchiyama, JP
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties36%
G01RMeasuring electric variables18%
G06TImage data processing or generation, in general18%
B65HHandling thin or filamentary material, e.g. sheets, webs, cables9%
H05KPrinted circuits9%
Y10TTechnical subjects covered by former us classification9%
PatentTitleYear
9,120,639'Document processing device and document processing method'20157,869,644'Methods of and apparatus for inspecting substrate'20117,505,149'Apparatus for surface inspection and method and apparatus for inspecting substrate'20097,394,084'Method of generating image and illumination device for inspecting substrate'20087,310,406'Inspection method and system for and method of producing component mounting substrate'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2011Patents assigned to OMRON TATEISI ELECTRONICS CO (4)· patent assignee history
2007–2011Based in Fukuchiyama, JP· patent location history
2015Patents assigned to KOYAMA FUMIO (1)· patent assignee history
2015Patents assigned to KURIYAMA JUN (1)· patent assignee history
2015Patents assigned to PRIMAGEST INC (1)· patent assignee history
2015Based in Yokohama, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| OMRON TATEISI ELECTRONICS CO | 4 | 2007–2011 |
| KOYAMA FUMIO | 1 | 2015 |
| KURIYAMA JUNself | 1 | 2015 |
| PRIMAGEST INC | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Fukuchiyama, JP | 4 | 2007–2011 |
| Yokohama, JP | 1 | 2015 |