Inventor

Kiyomi Yoshinari

Inventor

Hitachi, JP

Overview

1996–2021

Patent span

Electricity

Primary field (CPC H)

Patents· 35 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Jprimary

H01JElectric discharge tubes or discharge lamps71%

G01NInvestigating or analysing materials by determining their chemical or physical properties13%

G16BBioinformatics, i.e. information and communication technology [ict] specially adapted for genetic or protein-related data processing in computational molecular biology6%

G16CComputational chemistry6%

Y10TTechnical subjects covered by former us classification4%

PatentTitleYear

11,049,706Mass spectrometer and nozzle member2021 11,011,361Mass spectrometer and nozzle member2021 10,607,825Mass spectrometer2020 10,332,736Mass spectrometer with ion frequency selection2019 10,229,821Mass spectrometry device2019 10,068,756Mass spectrometer2018 7,932,486'Mass spectrometer system'2011 7,595,484'Mass spectrometric method, mass spectrometric system, diagnosis system, inspection system, and mass spectrometric program'2009 7,544,930'Tandem type mass analysis system and method'2009 7,473,892'Mass spectrometer system'2009 7,435,949'Mass spectrometric analysis method and system using the method'2008 7,332,713'Mass spectrometric method and mass spectrometric system'2008 7,180,056'Mass spectrometry and mass spectrometry system'2007 7,158,893'Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering system'2007 7,126,113'Mass spectrometry system'2006 7,075,069'Apparatus for mass spectrometry on an ion-trap method'2006 7,064,319'Mass spectrometer'2006 7,053,367'Mass spectrometer'2006 6,977,373'Ion trap mass analyzing apparatus'2005 6,957,159'System for analyzing compound structure'2005 6,917,037'Mass spectrum analyzing system'2005 6,914,239'System for analyzing mass spectrometric data'2005 6,907,352'Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering system'2005 6,852,972'Mass spectrometer'2005 6,759,652'Ion trap mass analyzing apparatus'2004 6,745,134'Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering system'2004 6,683,303'Ion trap mass spectrometer and spectrometry'2004 6,633,033'Apparatus for mass spectrometry on an ion-trap method'2003 6,541,769'Mass spectrometer'2003 6,140,641'Ion-trap mass analyzing apparatus and ion trap mass analyzing method'2000 6,121,610'Ion trap mass spectrometer'2000 6,043,491'Scanning electron microscope'2000 5,756,993'Mass spectrometer'1998 5,623,144'Mass spectrometer ring-shaped electrode having high ion selection efficiency and mass spectrometry method thereby'1997 5,532,483'Mass spectrometer and ion source'1996

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1996–2008Patents assigned to HITACHI LTD (15)· patent assignee history

1996–2011Based in Hitachi, JP· patent location history

2004–2021Patents assigned to HITACHI HIGH TECH CORP (18)· patent assignee history

2005–2021Based in Tokyo, JP· patent location history

2006Patents assigned to APPLERA CORP (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
HITACHI HIGH TECH CORP	18	2004–2021
HITACHI LTD	15	1996–2008
APPLERA CORP	1	2006

Locations

Location	Patents	Span
Hitachi, JP	26	1996–2011
Tokyo, JP	9	2005–2021