Inventor
Samhita Dasgupta
Inventor
Niskayuna, NY, US
Overview
Patents· 33 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions19%
F01DNon-positive displacement machines or engines, e.g. steam turbines14%
G02BOptical elements, systems or apparatus11%
F05DIndexing scheme for aspects relating to non-positive-displacement machines or engines, gas-turbines or jet-propulsion plants7%
G01DMeasuring not specially adapted for a specific variable4%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h104%
A61BDiagnosis3%
F04DNon-positive-displacement pumps3%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure3%
G01SRadio direction-finding3%
PatentTitleYear
10,180,074Wireless monitoring system20199,388,744'Distributed gas turbine engine control system with remote interface units'20168,790,006'Multiwavelength thermometer'20148,591,188'Displacement sensor system and method of operation'20138,588,558'Optical link circuit and method of making same'20138,536,878'Automated sensor specific calibration through sensor parameter download'20138,272,246'Electronic self-calibration for sensor clearance'20128,177,474'System and method for turbine engine clearance control with rub detection'20128,121,813'System and method for clearance estimation between two objects'20128,022,715'Automated sensor specific calibration through sensor parameter download'20117,891,938'Multi sensor clearance probe'20117,722,310'System and method for measuring clearance between two objects'20107,652,489'Multi-range clearance measurement system and method of operation'20107,615,009'System and method for optical data transmission in ultrasound imaging'20097,527,742'Etchant, method of etching, laminate formed thereby, and device'20097,466,143'Clearance measurement systems and methods of operation'20087,404,331'Sensor assembly, transformers and methods of manufacture'20087,402,808'Radiation imaging system and method'20087,367,945'Ultrasound system'20087,369,727'Apparatus for coupling electromagnetic energy and method of making'20087,333,913'Clearance measurement system and method of operation'20087,332,915'Sensor system and method of operating the same'20087,327,022'Assembly, contact and coupling interconnection for optoelectronics'20087,316,512'Interconnect device'20087,215,129'Multi tip clearance measurement system and method of operation'20077,181,972'Static and dynamic pressure sensor'20077,180,305'Sensor systems and methods of operation'20077,018,580'Method and apparatus for forming tapered waveguide structures'20066,987,619'Lens array package and fabrication method'20066,935,792'Optoelectronic package and fabrication method'20056,925,213'Micromachined fiber optic sensors'20056,818,466'Method of fabricating an integrated optoelectronic circuit'20046,711,312'Integrated optoelectronic circuit and method of fabricating the same'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2016Patents assigned to GEN ELECTRIC (30)· patent assignee history
2004–2019Based in Niskayuna, NY, US· patent location history
2006Based in Niskauna, NY, US· patent location history
2012–2019Patents assigned to DASGUPTA SAMHITA (9)· patent assignee history
2012–2016Patents assigned to ANDARAWIS EMAD ANDARAWIS (6)· patent assignee history
2012–2013Patents assigned to BALASUBRAMANIAM MAHADEVAN (5)· patent assignee history
2012–2013Patents assigned to CHAN DAVID SO KEUNG (4)· patent assignee history
2016Based in Schenectady, NY, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 30 | 2004–2016 |
| DASGUPTA SAMHITAself | 9 | 2012–2019 |
| ANDARAWIS EMAD ANDARAWIS | 6 | 2012–2016 |
| BALASUBRAMANIAM MAHADEVAN | 5 | 2012–2013 |
| CHAN DAVID SO KEUNG | 4 | 2012–2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Niskayuna, New York, US | 31 | 2004–2019 |
| Schenectady, New York, US | 1 | 2016 |
| Niskauna, New York, US | 1 | 2006 |