Inventor
Shin-ya Nakafuji
Inventor
Tokyo, JP
Overview
Patents· 15 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices20%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1019%
H01LSemiconductor devices16%
C08GMacromolecular compounds obtained otherwise than by reactions only involving unsaturated carbon-to-carbon bonds9%
C09DCoating compositions, e.g. paints, varnishes or lacquers9%
C07CAcyclic or carbocyclic compounds8%
C08LCompositions of macromolecular compounds7%
B44CProducing decorative effects4%
C08FMacromolecular compounds obtained by reactions only involving carbon-to-carbon unsaturated bonds4%
C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients3%
PatentTitleYear
11,126,084Composition for resist underlayer film formation, resist underlayer film and forming method thereof, production method of patterned substrate, and compound202110,146,131Composition, method for producing patterned substrate, film and forming method thereof, and compound201810,053,539Composition for film formation, film, production method of patterned substrate, and compound20189,696,626'Composition for forming a resist underlayer film, and pattern-forming method'20179,620,378'Composition for film formation, film, production method of patterned substrate, and compound'20179,581,905'Composition for film formation, resist underlayer film and forming method thereof, pattern-forming method and compound'20179,447,303'Composition for forming resist underlayer film'20169,400,429'Composition for forming a resist underlayer film, and pattern-forming method'20169,170,493'Resist underlayer film-forming composition, pattern-forming method and resist underlayer film'20159,134,611'Composition for forming resist underlayer film and pattern-forming method'20159,091,922'Resin composition, resist underlayer film, resist underlayer film-forming method and pattern-forming method'20159,090,119'Pattern forming method'20159,040,232'Method for pattern formation, method and composition for resist underlayer film formation, and resist underlayer film'20158,871,432'Pattern-forming method, resist underlayer film, and composition for forming resist underlayer film'20148,715,916'Pattern forming method and resist underlayer film-forming composition'2014Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2014–2021Patents assigned to JSR CORP (15)· patent assignee history
2014–2015Patents assigned to MINEGISHI SHIN-YA (2)· patent assignee history
2014–2015Patents assigned to NAKAFUJI SHIN-YA (2)· patent assignee history
2014–2021Based in Tokyo, JP· patent location history
2015Patents assigned to KIMURA TORU (1)· patent assignee history
2015Patents assigned to MURAKAMI SATORU (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| JSR CORP | 15 | 2014–2021 |
| MINEGISHI SHIN-YA | 2 | 2014–2015 |
| NAKAFUJI SHIN-YAself | 2 | 2014–2015 |
| KIMURA TORU | 1 | 2015 |
| MURAKAMI SATORU | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 15 | 2014–2021 |