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Inventor

Wilfred Hartmann

Inventor
Gechingen, DE

Overview

2→
Patents
2000–2001
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables100%
PatentTitleYear
6,219,811'Test circuit and method for interconnect testing of chips'20016,029,261'Test circuit and system for interconnect testing of high-level packages'2000

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2000–2001Patents assigned to IBM (2)· patent assignee history
2000–2001Based in Gechingen, DE· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
IBM22000–2001
Locations
LocationPatentsSpan
Gechingen, DE22000–2001