Inventor
Jan-Peter Hauschild
Inventor
Eindhoven, NL
Overview
Patents· 19 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps43%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices25%
H05KPrinted circuits7%
B81CProcesses or apparatus specially adapted for the manufacture or treatment of microstructural devices or systems4%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure4%
G01NInvestigating or analysing materials by determining their chemical or physical properties4%
G02BOptical elements, systems or apparatus4%
H01LSemiconductor devices4%
Y02PClimate change mitigation technologies in the production or processing of goods4%
Y10TTechnical subjects covered by former us classification4%
PatentTitleYear
11,087,969Charge detection for ION current control202111,062,895Mass spectrometer having improved quadrupole robustness202110,811,243Ion supply system and method to control an ion supply system20209,870,906'Multipole PCB with small robotically installed rod segments'20189,698,002'Method and apparatus for mass analysis utilizing ion charge feedback'20179,543,131'Method of operating a mass filter in mass spectrometry'20179,536,722'Ion guide'20179,460,905'Method of assessing vacuum conditions in a mass spectrometer with transient signal decay rates'20169,324,547'Method and apparatus for mass analysis utilizing ion charge feedback'20169,007,784'Device for self-aligning and affixing of a microchannel plate in a micro-system and method the same'20158,841,604'Mass analyser'20148,134,120'Mass spectrometer'20127,834,975'Method and exposure apparatus for performing a tilted focus and a device manufactured accordingly'20107,518,706'Exposure apparatus, a tilting device method for performing a tilted focus test, and a device manufactured accordingly'20097,502,096'Lithographic apparatus, calibration method, device manufacturing method and computer program product'20097,502,097'Method and exposure apparatus for performing a tilted focus and a device manufactured accordingly'20097,355,675'Method for measuring information about a substrate, and a substrate for use in a lithographic apparatus'20087,298,455'Lithographic apparatus and device manufacturing method'20077,209,214'Lithographic apparatus focus test method and system, and device manufacturing method'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2010Patents assigned to ASML NETHERLANDS BV (7)· patent assignee history
2007–2010Based in Eindhoven, NL· patent location history
2012–2016Patents assigned to HAUSCHILD JAN-PETER (4)· patent assignee history
2012–2015Based in Hamburg, DE· patent location history
2014–2016Patents assigned to KHOLOMEEV ALEXANDER (2)· patent assignee history
2014–2017Based in Bremen, DE· patent location history
2016–2018Patents assigned to THERMO FISHER SCIENT (BREMEN) GMBH (5)· patent assignee history
2016–2021Based in Weyhe, DE· patent location history
2020–2021Patents assigned to THERMO FISHER SCIENT BREMEN GMBH (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ASML NETHERLANDS BV | 7 | 2007–2010 |
| THERMO FISHER SCIENT (BREMEN) GMBH | 5 | 2016–2018 |
| HAUSCHILD JAN-PETERself | 4 | 2012–2016 |
| THERMO FISHER SCIENT BREMEN GMBH | 3 | 2020–2021 |
| KHOLOMEEV ALEXANDER | 2 | 2014–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Eindhoven, NL | 7 | 2007–2010 |
| Weyhe, DE | 6 | 2016–2021 |
| Bremen, DE | 4 | 2014–2017 |
| Hamburg, DE | 2 | 2012–2015 |