Inventor

Michael Kuchel

Inventor

Oberkochen, DE

Overview

23→

Patents

1989–2011

Patent span

Physics

Primary field (CPC G)

Patents· 23 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary

G01BMeasuring length, thickness or similar linear dimensions45%

G01MTesting static or dynamic balance of machines or structures18%

G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light14%

G06TImage data processing or generation, in general9%

G01SRadio direction-finding2%

G02BOptical elements, systems or apparatus2%

G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices2%

H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light2%

H05KPrinted circuits2%

Y10TTechnical subjects covered by former us classification2%

PatentTitleYear

7,948,638'Scanning interferometric methods and apparatus for measuring aspheric surfaces and wavefronts'2011 7,889,356'Two grating lateral shearing wavefront sensor'2011 7,612,893'Scanning interferometric methods and apparatus for measuring aspheric surfaces and wavefronts'2009 7,289,224'Low coherence grazing incidence interferometry for profiling and tilt sensing'2007 7,218,403'Scanning interferometer for aspheric surfaces and wavefronts'2007 6,972,849'Scanning interferometer for aspheric surfaces and wavefronts'2005 6,943,896'Reconfigurable interferometer system'2005 6,879,402'Scanning interferometer for aspheric surfaces and wavefronts'2005 6,816,267'Apparatus and method for calibrating an interferometer using a selectively rotatable sphere'2004 6,781,700'Scanning interferometer for aspheric surfaces and wavefronts'2004 6,734,979'Rapid in situ mastering of an aspheric Fizeau with residual error compensation'2004 6,717,679'Dispersive null-optics for aspheric surface and wavefront metrology'2004 6,717,680'Apparatus and method for phase-shifting interferometry'2004 6,714,308'Rapid in-situ mastering of an aspheric fizeau'2004 5,361,312'Method and apparatus for phase evaluation of pattern images used in optical measurement'1994 5,357,341'Method for evaluating interferograms and interferometer therefor'1994 5,343,294'Method for analyzing periodic brightness patterns'1994 5,135,308'Method and apparatus for non-contact measuring of object surfaces'1992 5,135,309'Method and apparatus for non-contact measuring of object surfaces'1992 5,106,194'Method and apparatus for absolute interferometric testing of plane surfaces'1992 5,054,912'Optical distance-measuring device'1991 5,042,041'Radiation source for partially coherent radiation'1991 4,872,755'Interferometer for measuring optical phase differences'1989

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1989–1994Patents assigned to ZEISS STIFTUNG (9)· patent assignee history

1989–2011Based in Oberkochen, DE· patent location history

1991Based in Aalen, DE· patent location history

2004–2011Patents assigned to ZYGO CORP (12)· patent assignee history

2005Patents assigned to KUECHEL MICHAEL (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
ZYGO CORP	12	2004–2011
ZEISS STIFTUNG	9	1989–1994
KUECHEL MICHAEL	1	2005

Locations

Location	Patents	Span
Oberkochen, DE	22	1989–2011
Aalen, DE	1	1991