Inventor
Seizo Uchiyama
Inventor
Nagano, JP
Overview
Patents· 1 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables100%
PatentTitleYear
8,610,446'Testing device and testing method'2013Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2013Patents assigned to FUJI ELECTRIC CO LTD (1)· patent assignee history
2013Patents assigned to NISHIZAWA TORU (1)· patent assignee history
2013Patents assigned to TOYA HIROYUKI (1)· patent assignee history
2013Patents assigned to UCHIYAMA SEIZO (1)· patent assignee history
2013Patents assigned to YOSHIDA ATSUSHI (1)· patent assignee history
2013Based in Nagano, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| FUJI ELECTRIC CO LTD | 1 | 2013 |
| NISHIZAWA TORU | 1 | 2013 |
| TOYA HIROYUKI | 1 | 2013 |
| UCHIYAMA SEIZOself | 1 | 2013 |
| YOSHIDA ATSUSHI | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Nagano, JP | 1 | 2013 |