Inventor
Mitsuhiro Nagashima
Inventor
Tokyo, JP
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
B82Yprimary
B82YSpecific uses or applications of nanostructures22%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light22%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation22%
H10HInorganic light-emitting semiconductor devices having potential barriers11%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution11%
PatentTitleYear
8,395,106'Optical semiconductor device with quantum dots having configurational anisotropy'20138,373,155'Infrared photodetector'20135,966,590'Method for manufacturing thermal-type infrared sensor'19995,801,383'VOX film, wherein X is greater than 1.875 and less than 2.0, and a bolometer-type infrared sensor comprising the VOX film'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998–1999Patents assigned to NEC CORP (2)· patent assignee history
1998–1999Based in Tokyo, JP· patent location history
2013Patents assigned to FUJITSU LTD (2)· patent assignee history
2013Patents assigned to KIBE MICHIYA (2)· patent assignee history
2013Patents assigned to MATSUKURA YUSUKE (2)· patent assignee history
2013Patents assigned to NAGASHIMA MITSUHIRO (2)· patent assignee history
2013Based in Suginama, JP· patent location history
2013Based in Suginami-ku, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| FUJITSU LTD | 2 | 2013 |
| KIBE MICHIYA | 2 | 2013 |
| MATSUKURA YUSUKE | 2 | 2013 |
| NAGASHIMA MITSUHIROself | 2 | 2013 |
| NEC CORP | 2 | 1998–1999 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 2 | 1998–1999 |
| Suginama, JP | 1 | 2013 |
| Suginami-ku, JP | 1 | 2013 |