Inventor
Feng-Cheng Yang
Inventor
Hsinchu County, TW
Overview
Patents· 57 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Dprimary
H10DInorganic electric semiconductor devices28%
H01LSemiconductor devices26%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1015%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1014%
G06FElectric digital data processing4%
H10BElectronic memory devices3%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution2%
G11CStatic stores1%
B60SServicing, cleaning, repairing, supporting, lifting, or manoeuvring of vehicles, not otherwise provided for1%
B64GCosmonautics1%
PatentTitleYear
11,079,239Method for directly planning reentry trajectory in height-velocity profile202110,879,395Method for forming semiconductor device structure with cap layer202010,872,889Semiconductor component and fabricating method thereof202010,868,151Conformal transfer doping method for fin-like field effect transistor202010,868,130Semiconductor device and method of manufacture202010,861,753Air gap formation between gate spacer and epitaxy structure202010,861,749Using a metal-containing layer as an etching stop layer and to pattern source/drain regions of a FinFET202010,854,726Integrated circuit with doped low-k sidewall spacers for gate stacks202010,770,354Method of forming integrated circuit with low-k sidewall spacers for gate stacks202010,756,171Integrated circuit device with source/drain barrier202010,748,820Source/drain features with an etch stop layer202010,714,619PMOS FinFET202010,680,084Epitaxial structures for fin-like field effect transistors202010,629,736Semiconductor structure and method for semiconductor device fabrication with improved source drain epitaxy202010,579,560Transaction-based hybrid memory202010,535,569Forming transistor by selectively growing gate spacer202010,529,803Semiconductor device with epitaxial source/drain202010,529,725Flexible merge scheme for source/drain epitaxy regions202010,522,642Semiconductor device with air-spacer201910,522,420Source/drain features with an etch stop layer201910,522,680Finfet semiconductor device structure with capped source drain structures201910,497,628Methods of forming epitaxial structures in fin-like field effect transistors201910,483,266Flexible merge scheme for source/drain epitaxy regions201910,453,753Using a metal-containing layer as an etching stop layer and to pattern source/drain regions of a FinFET201910,453,501Hybrid LPDDR4-DRAM with cached NVM and flash-NAND in multi-chip packages for mobile devices201910,403,551Source/drain features with an etch stop layer201910,283,624Semiconductor structure and method for forming the same201910,276,691Conformal transfer doping method for fin-like field effect transistor201910,269,935Semiconductor device including Fin-PET and manufacturing method thereof201910,217,815Integrated circuit device with source/drain barrier201910,158,017Semiconductor structure and method for semiconductor device fabrication with improved source drain epitaxy201810,158,007Semiconductor device and manufacturing method thereof201810,141,231FinFET device with wrapped-around epitaxial structure and manufacturing method thereof201810,134,902PMOS FinFET201810,127,074Transaction identification synchronization201810,103,146FinFET device with epitaxial structures that wrap around the fins and the method of fabricating the same201810,068,992Semiconductor device including fin FET and manufacturing method thereof201810,037,923Forming transistor by selectively growing gate spacer20189,940,980Hybrid LPDDR4-DRAM with cached NVM and flash-nand in multi-chip packages for mobile devices20189,942,463Camera device without image displaying function20189,882,029'Semiconductor device including Fin-FET and manufacturing method thereof'20189,865,504'Semiconductor device and manufacturing method thereof'20189,865,595'FinFET device with epitaxial structures that wrap around the fins and the method of fabricating the same'20189,812,576'Semiconductor device and manufacturing method thereof'20179,780,214'Semiconductor device including Fin- FET and manufacturing method thereof'20179,748,389'Method for semiconductor device fabrication with improved source drain epitaxy'20179,742,402'Keyswitch and keyboard with distance detecting function'20179,680,017'Semiconductor device including Fin FET and manufacturing method thereof'20179,570,556'Semiconductor device and manufacturing method thereof'20179,285,926'Input device with optical module for determining a relative position of an object thereon'20168,937,595'Optical touch control apparatus and adjustable light guide apparatus'20158,914,197'Windshield wiper controller, optical raindrop detector and detection method thereof'20148,823,099'Semiconductor device having gradient doping profile'20148,760,403'Hybrid human-interface device'20148,501,569'Semiconductor device having gradient doping profile'20137,206,418'Noise suppression for a wireless communication device'20076,797,587'Active region corner implantation method for fabricating a semiconductor integrated circuit microelectronic fabrication'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2014Patents assigned to TAIWAN SEMICONDUCTOR MFG (3)· patent assignee history
2013–2016Patents assigned to YANG FENG-CHENG (2)· patent assignee history
2013–2020Based in Hsinchu County, TW· patent location history
2014–2018Patents assigned to PIXART IMAGING INC (6)· patent assignee history
2014–2020Based in Hsinchu, TW· patent location history
2014–2020Based in Zhudong Township, TW· patent location history
2017–2020Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (42)· patent assignee history
2018–2020Patents assigned to FUTUREWEI TECHNOLOGIES INC (4)· patent assignee history
2018–2020Based in Portland, OR, US· patent location history
2021Based in Dalian, CN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TAIWAN SEMICONDUCTOR MFG CO LTD | 42 | 2017–2020 |
| PIXART IMAGING INC | 6 | 2014–2018 |
| FUTUREWEI TECHNOLOGIES INC | 4 | 2018–2020 |
| TAIWAN SEMICONDUCTOR MFG | 3 | 2004–2014 |
| YANG FENG-CHENGself | 2 | 2013–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hsinchu County, TW | 31 | 2013–2020 |
| Hsinchu, TW | 10 | 2014–2020 |
| Zhudong Township, TW | 9 | 2014–2020 |
| Portland, OR, US | 4 | 2018–2020 |
| Dalian, CN | 1 | 2021 |