Inventor
Tal YAZIV
Inventor
US
Overview
Patents· 3 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices23%
G01BMeasuring length, thickness or similar linear dimensions15%
H01LSemiconductor devices15%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1015%
G01CMeasuring distances, levels or bearings8%
G01NInvestigating or analysing materials by determining their chemical or physical properties8%
G06FElectric digital data processing8%
G06NComputing arrangements based on specific computational models8%
PatentTitleYear
11,862,522Accuracy improvements in optical metrology202411,761,969System and method for analyzing a sample with a dynamic recipe based on iterative experimentation and feedback202311,454,894Systems and methods for scatterometric single-wavelength measurement of misregistration and amelioration thereof2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2023Patents assigned to KLA CORP (2)· patent assignee history
2022–2023Based in US· patent location history
2024Patents assigned to KLA TENCOR CORP (1)· patent assignee history
2024Based in IL· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA CORP | 2 | 2022–2023 |
| KLA TENCOR CORP | 1 | 2024 |
Locations
| Location | Patents | Span |
|---|---|---|
| US | 2 | 2022–2023 |
| IL | 1 | 2024 |