Inventor
Emanuel Gofman
Inventor
Haifa, IL
Overview
Patents· 15 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices61%
G06FElectric digital data processing22%
G01NInvestigating or analysing materials by determining their chemical or physical properties6%
G01RMeasuring electric variables6%
H01JElectric discharge tubes or discharge lamps6%
PatentTitleYear
7,840,057'Simultaneous computation of multiple points on one or multiple cut lines'20107,774,737'Performance in model-based OPC engine utilizing efficient polygon pinning method'20107,761,839'Performance in model-based OPC engine utilizing efficient polygon pinning method'20107,512,524'Preparing peptide spectra for identification'20097,434,196'Renesting interaction map into design for efficient long range calculations'20087,366,342'Simultaneous computation of multiple points on one or multiple cut lines'20087,343,271'Incorporation of a phase map into fast model-based optical proximity correction simulation kernels to account for near and mid-range flare'20087,287,239'Performance in model-based OPC engine utilizing efficient polygon pinning method'20077,131,104'Fast and accurate optical proximity correction engine for incorporating long range flare effects'20067,127,699'Method for optimizing a number of kernels used in a sum of coherent sources for optical proximity correction in an optical microlithography process'20067,055,126'Renesting interaction map into design for efficient long range calculations'20067,010,776'Extending the range of lithographic simulation integrals'20066,189,130'System and method for determining density maps in hierarchical designs'20015,317,528'Random number generator'19945,202,889'Dynamic process for the generation of biased pseudo-random test patterns for the functional verification of hardware designs'1993Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1993–2010Patents assigned to IBM (15)· patent assignee history
1993–2010Based in Haifa, IL· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 15 | 1993–2010 |
Locations
| Location | Patents | Span |
|---|---|---|
| Haifa, IL | 15 | 1993–2010 |