Inventor
Peter Seitz
Inventor
Urdorf, CH
Overview
Patents· 44 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
A61Bprimary
A61BDiagnosis15%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation13%
H04NPictorial communication, e.g. television11%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light8%
G02CSpectacles6%
G01BMeasuring length, thickness or similar linear dimensions5%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure5%
G01SRadio direction-finding5%
G01NInvestigating or analysing materials by determining their chemical or physical properties4%
G01DMeasuring not specially adapted for a specific variable3%
PatentTitleYear
10,758,124Device and method for distance determination and/or centering using corneal reflections202010,736,504Method for determining the pupil diameter of an eye with high accuracy, and corresponding apparatus202010,520,751Apparatus and method for determining optical parameters201910,368,737Method for determining visual acuity201910,335,056Sensor for electrically measuring a force having a spring unit arranged in-between surfaces201910,281,739Brightness-dependent adjustment of a spectacle lens201910,216,010Determining user data based on image data of a selected eyeglass frame201910,032,951Semiconductor photosensor for infrared radiation20189,733,136'Textile pressure sensor'20179,696,563'Brightness-dependent adjustment of a spectacle lens'20179,086,493'High-sensitivity X-ray detector'20158,760,147'Charge pulse detecting circuit'20148,563,916'Compact low noise signal readout circuit having at least one open-loop amplifier and method for operating thereof'20138,436,401'Solid-state photosensor with electronic aperture control'20138,329,284'Identification device and application thereof'20128,299,504'Image sensing device and method of'20128,179,119'Charge sampling device and method'20128,119,972'Solid-state image sensing device having a low-pass filter for limiting signal frequencies passing to the output node of an inverting amplifier'20128,106,472'Image sensor with large-area, high-sensitivity and high-speed pixels'20127,923,673'Large-area pixel for use in an image sensor'20117,701,028'Image sensor with large-area, high-sensitivity and high-speed pixels'20107,659,991'Colorimetric three-dimensional microscopy'20107,595,476'Electrical circuit, apparatus and method for the demodulation of an intensity-modulated signal'20097,550,705'Highly sensitive solid-state image sensor'20097,498,621'Image sensing device and method of'20097,060,957'Device and method for spatially resolved photodetection and demodulation of modulated electromagnetic waves'20067,038,235'Integrated-optical microsystem based on organic semiconductors'20066,927,793'Method and device for forming an image'20056,921,891'Photodetector with high dynamic range and increased operating temperature'20056,758,595'Imaging pyrometer'20046,469,489'Adaptive array sensor and electrical circuit therefore'20026,268,921'Interferometric device for recording the depth optical reflection and/or transmission characteristics of an object'20016,222,627'Wollaston prism and use of it in a fourier-transform spectrometer'20016,219,135'Device for optically recording, digitally, a parameter on a longitudinally moved thread-type material'20015,936,866'Light-detection system with programmable offset current'19995,856,667'Apparatus and method for detection and demodulation of an intensity-modulated radiation field'19995,521,395'Method and apparatus for determining the structure of yarns in the region of their surface'1996D0365999'Pressure measuring insole'19965,088,503'Method and apparatus for the production of inserts'19925,003,615'Optoelectronic system for determining surface irregularities of a workpiece having a nominally plane reflective surface'19914,862,743'Device for measuring the areal distribution of compressive forces'19894,836,033'Capacitive measuring assembly for determining forces and pressures'19894,227,613'Lid for goods dispatch container'19804,050,561'Conveyor for stacking cases in a run-through storage structure'1977Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1977–2019Patents assigned to SEITZ PETER (16)· patent assignee history
1977–1980Based in Bad Duerkheim, DE· patent location history
1989Based in D-8000 Munchen 40, DE· patent location history
1992–2020Based in Munich, DE· patent location history
1999Based in Kuesnacht, CH· patent location history
2001–2015Patents assigned to SUISSE ELECTRONIQUE MICROTECH (16)· patent assignee history
2001–2018Based in Urdorf, CH· patent location history
2009–2012Patents assigned to MESA IMAGING AG (5)· patent assignee history
2012–2014Patents assigned to LOTTO CHRISTIAN (3)· patent assignee history
2017–2020Patents assigned to RODENSTOCK GMBH (7)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SEITZ PETERself | 16 | 1977–2019 |
| SUISSE ELECTRONIQUE MICROTECH | 16 | 2001–2015 |
| RODENSTOCK GMBH | 7 | 2017–2020 |
| MESA IMAGING AG | 5 | 2009–2012 |
| LOTTO CHRISTIAN | 3 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Urdorf, CH | 22 | 2001–2018 |
| Munich, DE | 11 | 1992–2020 |
| Kuesnacht, CH | 2 | 1999 |
| D-8000 Munchen 40, DE | 2 | 1989 |
| Bad Duerkheim, DE | 2 | 1977–1980 |