Inventor

Joachim Hartjes

Inventor
Aalen, DE

Overview

24→
Patents
2013–2021
Patent span
Physics
Primary field (CPC G)

Patents· 24 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices43%
G02BOptical elements, systems or apparatus26%
G01BMeasuring length, thickness or similar linear dimensions4%
G21KHandling of particles or ionising radiation not otherwise provided for4%
B29CShaping or joining of plastics2%
F16FSprings2%
F25BRefrigeration machines, plants or systems2%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light2%
G01KMeasuring temperature2%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure2%
PatentTitleYear
11,054,755Optical module with an anticollision device for module components202110,613,443Optical system, lithography apparatus and method202010,288,894Optical component for use in a radiation source module of a projection exposure system201910,162,267Projection exposure apparatus including mechanism to reduce influence of pressure fluctuations201810,162,270Projection exposure apparatus comprising a measuring system for measuring an optical element201810,146,138Method for producing an optical element for an optical system, in particular for a microlithographic projection exposure apparatus201810,012,911Projection exposure apparatus with wavefront measuring device and optical wavefront manipulator20189,846,375Lithography apparatus with segmented mirror20179,759,550'Projection exposure apparatus for microlithography comprising an optical distance measurement system'20179,714,822'Projection exposure apparatus for microlithography comprising an optical distance measurement system'20179,684,243'Blocking element for protecting optical elements in projection exposure apparatuses'20179,671,584'Method and cooling system for cooling an optical element for EUV applications'20179,599,910'Facet mirror device'20179,500,957'Arrangement for thermal actuation of a mirror in a microlithographic projection exposure apparatus'20169,482,959'EUV microlithography illumination optical system and EUV attenuator for same'20169,465,208'Facet mirror device'20169,423,590'Liquid cooled EUV reflector'20169,207,541'Arrangement for mirror temperature measurement and/or thermal actuation of a mirror in a microlithographic projection exposure apparatus'20159,134,501'Optical element unit and method of supporting an optical element'20159,063,336'Optical element having a plurality of reflective facet elements'20158,831,170'Mirror with a mirror carrier and projection exposure apparatus'20148,587,767'Illumination optics for EUV microlithography and related system and apparatus'20138,441,747'Optical module with minimized overrun of the optical element'20138,345,219'Method and apparatus for setting an illumination optical unit'2013

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2013–2021Patents assigned to ZEISS CARL SMT GMBH (23)· patent assignee history
2013–2016Patents assigned to HARTJES JOACHIM (7)· patent assignee history
2013–2016Patents assigned to BINGEL ULRICH (2)· patent assignee history
2013–2015Patents assigned to ENDRES MARTIN (2)· patent assignee history
2013–2015Patents assigned to FEDERAU HAGEN (2)· patent assignee history
2013–2021Based in Aalen, DE· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
ZEISS CARL SMT GMBH232013–2021
HARTJES JOACHIMself72013–2016
BINGEL ULRICH22013–2016
ENDRES MARTIN22013–2015
FEDERAU HAGEN22013–2015
Locations
LocationPatentsSpan
Aalen, DE242013–2021