Inventor
Mohan Mahadevan
Inventor
Livermore, CA, US
Overview
Patents· 21 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties16%
G06TImage data processing or generation, in general14%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%
G06FElectric digital data processing7%
G06KGraphical data reading7%
G06VImage or video recognition or understanding7%
H01LSemiconductor devices7%
G05BControl or regulating systems in general4%
G06NComputing arrangements based on specific computational models4%
B31DMaking articles of paper, cardboard or material worked in a manner analogous to paper, not provided for in subclasses b31b or b31c3%
PatentTitleYear
11,123,944Packaging items using customized 3D-printed dunnage202110,967,995Inflatable packaging materials, automated packaging systems, and related methods202110,769,761Generating high resolution images from low resolution images for semiconductor applications202010,733,744Learning based approach for aligning images acquired with different modalities202010,605,744Systems and methods for detecting defects on a wafer202010,607,119Unified neural network for defect detection and classification202010,533,954Apparatus and methods for combined brightfield, darkfield, and photothermal inspection202010,395,362Contour based defect detection201910,360,477Accelerating semiconductor-related computations using learning based models201910,290,088Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughput20199,880,107'Systems and methods for detecting defects on a wafer'20189,772,297'Apparatus and methods for combined brightfield, darkfield, and photothermal inspection'20179,734,568'Automated inline inspection and metrology using shadow-gram images'20179,645,097'In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning'20179,640,449'Automated inline inspection of wafer edge strain profiles using rapid photoreflectance spectroscopy'20179,569,834'Automated image-based process monitoring and control'20179,360,863'Data perturbation for wafer inspection or metrology setup using a model of a difference'20169,053,390'Automated inspection scenario generation'20158,467,047'Systems and methods for detecting defects on a wafer'20138,223,327'Systems and methods for detecting defects on a wafer'20128,126,255'Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions'2012Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2012–2020Patents assigned to KLA TENCOR CORP (19)· patent assignee history
2012–2016Patents assigned to MAHADEVAN MOHAN (5)· patent assignee history
2012–2016Patents assigned to KIRKWOOD JASON (4)· patent assignee history
2012–2016Patents assigned to KULKARNI ASHOK (3)· patent assignee history
2012–2020Based in Livermore, CA, US· patent location history
2015–2020Based in Santa Clara, CA, US· patent location history
2021Patents assigned to AMAZON TECH INC (2)· patent assignee history
2021Based in Seattle, WA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA TENCOR CORP | 19 | 2012–2020 |
| MAHADEVAN MOHANself | 5 | 2012–2016 |
| KIRKWOOD JASON | 4 | 2012–2016 |
| KULKARNI ASHOK | 3 | 2012–2016 |
| AMAZON TECH INC | 2 | 2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| Livermore, California, US | 12 | 2012–2020 |
| Santa Clara, California, US | 7 | 2015–2020 |
| Seattle, Washington, US | 2 | 2021 |