Inventor
Osamu Nasu
Inventor
Tokyo, JP
Overview
Patents· 34 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps21%
G06FElectric digital data processing14%
G01NInvestigating or analysing materials by determining their chemical or physical properties11%
G05BControl or regulating systems in general10%
G01RMeasuring electric variables7%
G06KGraphical data reading5%
G06NComputing arrangements based on specific computational models5%
G06TImage data processing or generation, in general4%
H04LTransmission of digital information, e.g. telegraphic communication4%
H04NPictorial communication, e.g. television4%
PatentTitleYear
11,093,314Time-sequential data diagnosis device, additional learning method, and recording medium2021D0924909Display screen with graphical user interface202111,042,737Learning device, learning method and program202111,042,786Learning processing device, data analysis device, analytical procedure selection method, and recording medium202110,908,973Information processing device202110,871,994Information processing device and information processing method202010,833,924Data collecting apparatus, data collecting method, and program202010,805,399Data server unit and communication system including master-slave management circuitry202010,725,794Data processing device, data processing method, setting management device, and data processing system202010,613,960Information processing apparatus and information processing method2020D0876466Display screen with graphical user interface2020D0872117Display screen with graphical user interface20209,792,688'Position detection device'20179,605,981'Absolute encoder'20179,129,775'Specimen potential measuring method, and charged particle beam device'20159,000,366'Method and apparatus for measuring displacement between patterns and scanning electron microscope installing unit for measuring displacement between patterns'20158,954,496'Multi-screen display system'20158,817,869'Image processing device and method, and image display device and method'20148,766,182'Method for detecting information of an electric potential on a sample and charged particle beam apparatus'20148,487,250'Method for detecting information of an electronic potential on a sample and charged particle beam apparatus'20138,339,519'Image processing apparatus and method and image display apparatus and method'20128,304,725'Charged particle beam system'20128,294,118'Method for adjusting optical axis of charged particle radiation and charged particle radiation device'20128,263,934'Method for detecting information of an electric potential on a sample and charged particle beam apparatus'20128,200,006'Image processing apparatus for analysis of pattern matching failure'20128,080,789'Sample dimension measuring method and scanning electron microscope'20118,026,482'Charged particle beam apparatus and control method therefor'20117,851,754'Charged particle beam system'20107,714,288'Charged particle beam apparatus'20107,659,508'Method for measuring dimensions of sample and scanning electron microscope'20107,545,977'Image processing apparatus for analysis of pattern matching failure'20095,668,368'Apparatus for suppressing electrification of sample in charged beam irradiation apparatus'19975,576,538'Apparatus and method for ion beam neutralization'19965,466,929'Apparatus and method for suppressing electrification of sample in charged beam irradiation apparatus'1995Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1995–2011Patents assigned to HITACHI LTD (5)· patent assignee history
1995–1997Based in Katsuta, JP· patent location history
2009–2015Patents assigned to HITACHI HIGH TECH CORP (12)· patent assignee history
2009–2015Based in Hitachinaka, JP· patent location history
2011–2015Patents assigned to NASU OSAMU (10)· patent assignee history
2012–2021Patents assigned to MITSUBISHI ELECTRIC CORP (17)· patent assignee history
2012–2014Patents assigned to FUJIYAMA NAOYUKI (2)· patent assignee history
2012–2021Based in Tokyo, JP· patent location history
2017Based in Chiyoda-ku, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MITSUBISHI ELECTRIC CORP | 17 | 2012–2021 |
| HITACHI HIGH TECH CORP | 12 | 2009–2015 |
| NASU OSAMUself | 10 | 2011–2015 |
| HITACHI LTD | 5 | 1995–2011 |
| FUJIYAMA NAOYUKI | 2 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 15 | 2012–2021 |
| Hitachinaka, JP | 14 | 2009–2015 |
| Katsuta, JP | 3 | 1995–1997 |
| Chiyoda-ku, JP | 2 | 2017 |