Inventor
Robert John Filkins
Inventor
Niskayuna, NY, US
Overview
Patents· 55 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties27%
G02BOptical elements, systems or apparatus10%
A61BDiagnosis6%
G06TImage data processing or generation, in general5%
Y10TTechnical subjects covered by former us classification5%
C12QMeasuring or testing processes involving enzymes, nucleic acids or microorganisms4%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein4%
G01BMeasuring length, thickness or similar linear dimensions3%
G01SRadio direction-finding3%
H04BTransmission3%
PatentTitleYear
10,821,551Systems and methods for dynamic shaping of laser beam profiles in additive manufacturing202010,814,429Systems and methods for dynamic shaping of laser beam profiles for control of micro-structures in additively manufactured metals202010,603,001Energy modulated luminescence tomography202010,175,174Photoactivated chemical bleaching of dyes201910,082,451Microscope slides with quality controls thereon20189,817,221'Systems and methods for processing and imaging of biological samples'20179,518,982'Sequential analysis of biological samples'20169,164,015'Systems and methods for processing and imaging of biological samples'20159,097,900'Quantitative phase microscopy for high-contrast cell imaging using frequency domain phase shift'20158,964,183'Systems and methods for screening of biological samples'20158,948,488'Methods and systems for digitally enhancing an image of a stained material'20158,900,529'Microfluidic chamber device and fabrication'20148,822,147'Sequential analysis of biological samples'20148,818,069'Methods for scaling images to differing exposure times'20148,673,643'Closed loop monitoring of automated molecular pathology system'20148,532,398'Methods and apparatus for optical segmentation of biological samples'20138,508,589'Imaging systems and associated methods thereof'20138,396,269'Image quality assessment including comparison of overlapped margins'20138,179,432'Predictive autofocusing'20128,113,056'Mid-IR laser for generation of ultrasound using a CO2 laser and harmonic generation'20128,063,385'Method and apparatus for ultraviolet scan planning'20118,064,488'Mid-IR laser for generation of ultrasound'20118,060,348'Systems for analyzing tissue samples'20118,054,470'Method and apparatus for spectroscopic characterization of samples using a laser-ultrasound system'20117,821,646'Method and apparatus for generating mid-IR laser beam for ultrasound inspection'20107,741,045'Sequential analysis of biological samples'20107,667,851'Method and apparatus for using a two-wave mixing ultrasonic detection in rapid scanning applications'20107,629,125'Sequential analysis of biological samples'20097,615,009'System and method for optical data transmission in ultrasound imaging'20097,576,307'Microscope with dual image sensors for rapid autofocusing'20097,480,574'Method to characterize material using mathematical propagation models and ultrasonic signal'20097,411,991'Tunable laser'20087,367,945'Ultrasound system'20087,327,022'Assembly, contact and coupling interconnection for optoelectronics'20087,310,408'System and method for X-ray generation by inverse compton scattering'20077,123,393'Method and apparatus for holographic recording and retrieval'20067,117,134'Method to optimize generation of ultrasound using mathematical modeling for laser ultrasound inspection'20067,039,362'Wireless transceiver and method for remote ultrasonic measurements'20067,016,470'System and method for X-ray generation'20066,927,686'Method and apparatus for internet enabled, wireless remote sensor measurement'20056,856,918'Method to characterize material using mathematical propagation models and ultrasonic signal'20056,818,466'Method of fabricating an integrated optoelectronic circuit'20046,732,587'System and method for classification of defects in a manufactured object'20046,710,912'Technique for quasi-phase matching'20046,711,312'Integrated optoelectronic circuit and method of fabricating the same'20046,684,701'System and method of determining porosity in composite materials using ultrasound'20046,681,073'Fiber optic power control systems and methods'20046,668,654'Method and apparatus for generating specific frequency response for ultrasound testing'20036,649,900'Photoreceiver assembly for high-powered lasers'20036,335,943'System and method for ultrasonic laser testing using a laser source to generate ultrasound having a tunable wavelength'20026,176,135'System and method for laser-ultrasonic frequency control using optimal wavelength tuning'20016,142,019'Method of determining surface acoustic wave paths'20006,029,530'Finger controlled inspection apparatus'20005,895,871'Finger controlled inspection apparatus'19995,801,532'Hand-holdable eddy-current probe'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998–2020Patents assigned to GEN ELECTRIC (37)· patent assignee history
1998–2004Based in Fonda, NY, US· patent location history
2002–2012Patents assigned to LOCKHEED CORP (13)· patent assignee history
2003–2020Based in Niskayuna, NY, US· patent location history
2005–2009Based in Nishayana, NY, US· patent location history
2010Based in Nishkayuna, NY, US· patent location history
2011–2016Patents assigned to FILKINS ROBERT JOHN (14)· patent assignee history
2011–2016Patents assigned to MONTALTO MICHAEL CHRISTOPHER (3)· patent assignee history
2014–2015Patents assigned to CORWIN ALEX DAVID (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 37 | 1998–2020 |
| FILKINS ROBERT JOHNself | 14 | 2011–2016 |
| LOCKHEED CORP | 13 | 2002–2012 |
| CORWIN ALEX DAVID | 3 | 2014–2015 |
| MONTALTO MICHAEL CHRISTOPHER | 3 | 2011–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Niskayuna, New York, US | 45 | 2003–2020 |
| Fonda, New York, US | 7 | 1998–2004 |
| Nishayana, New York, US | 2 | 2005–2009 |
| Nishkayuna, New York, US | 1 | 2010 |