Inventor
Yoon-Jae Shin
Inventor
Icheon-si, KR
Overview
Patents· 45 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores59%
G05FSystems for regulating electric or magnetic variables15%
H03KPulse technique9%
G06FElectric digital data processing7%
H03LAutomatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses4%
G01KMeasuring temperature3%
G01RMeasuring electric variables1%
H02MApparatus for conversion between ac and ac, between ac and dc, or between dc and dc, and for use with mains or similar power supply systems1%
PatentTitleYear
10,546,635Semiconductor apparatus capable of providing the same current to all memory elements202010,516,384Circuit for generating voltage201910,249,367Semiconductor apparatus comprising a plurality of current sink units201910,210,927Semiconductor apparatus comprising a plurality of current sink units20199,690,310'Internal voltage generator of semiconductor device and method for driving the same'20179,659,640'Semiconductor memory apparatus comprising a plurality of current sink units'20179,542,124'Electronic device and method for operating the same'20179,508,411'Word line driver circuit and resistance variable memory apparatus having the same'20169,508,398'Voltage generation circuit, semiconductor memory device including the same, and method for driving the same'20169,437,289'Electronic device'20169,368,236'Semiconductor memory apparatus and test method thereof'20169,355,720'Write driver, variable resistance memory apparatus including the same, and operation method'20169,263,125'Nonvolatile memory apparatus, and semiconductor system and computer device using the same'20168,879,339'Write control device'20148,873,322'Nonvolatile memory apparatus'20148,791,684'Reference voltage generator'20148,767,451'Internal voltage generating circuit of phase change random access memory device and method thereof'20148,717,830'Nonvolatile semiconductor device and method for testing the same'20148,625,380'Internal voltage generating circuit of phase change random access memory device and method thereof'20148,526,226'Current control apparatus and phase change memory having the same'20138,395,934'Phase-change memory device'20138,345,495'Test circuit, nonvolatile semiconductor memory appratus using the same, and test method'20138,345,502'Internal voltage generating circuit of phase change random access memory device and method thereof'20138,283,971'Internal voltage generation circuit and semiconductor apparatus using the same'20128,210,744'Apparatus for detecting temperature using transistors'20128,194,473'Non-volatile semiconductor memory circuit'20128,183,898'Apparatus for supplying voltage free noise and method of operation the same'20128,085,056'Circuit for testing internal voltage of semiconductor memory apparatus'20118,036,062'Semiconductor memory device and method for driving the same'20117,999,582'Apparatus for supplying voltage free from noise and method of operation the same'20117,990,189'Power-up signal generating circuit and integrated circuit using the same'20117,983,076'Non-volatile semiconductor memory circuit for generating write voltage'20117,936,635'Semiconductor memory device and method for driving the same'20117,916,566'Voltage control apparatus and method of controlling voltage using the same'20117,898,270'Circuit for testing internal voltage of semiconductor memory apparatus'20117,835,198'Apparatus and method for detecting leakage current of semiconductor memory device, and internal voltage generating circuit using the same'20107,825,718'Pumping voltage detector'20107,816,977'Core voltage generator'20107,791,945'Semiconductor memory device including apparatus for detecting threshold voltage'20107,710,817'Semiconductor memory device having a delay locked loop (DLL) and method for driving the same'20107,661,879'Apparatus for detecting temperature using transistors'20107,642,837'Internal voltage generation circuit for semiconductor device and method for generating internal voltage therein'20107,599,240'Internal voltage generator of semiconductor memory device'20097,502,268'Voltage control apparatus and method of controlling voltage using the same'20097,417,494'Internal voltage generator'2008Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2008–2013Patents assigned to HYNIX SEMICONDUCTOR INC (22)· patent assignee history
2008–2011Based in Kyungki-do, KR· patent location history
2009–2017Based in Gyeonggi-do, KR· patent location history
2010–2011Based in Ichon-shi, KR· patent location history
2011–2014Patents assigned to SHIN YOON JAE (9)· patent assignee history
2012–2020Patents assigned to SK HYNIX INC (22)· patent assignee history
2012–2013Patents assigned to SHIN YOON-JAE (3)· patent assignee history
2012–2020Based in Icheon-si, KR· patent location history
2013–2014Patents assigned to LYM SANG KUG (3)· patent assignee history
2013Based in Ichon-si, KR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HYNIX SEMICONDUCTOR INC | 22 | 2008–2013 |
| SK HYNIX INC | 22 | 2012–2020 |
| SHIN YOON JAEself | 9 | 2011–2014 |
| LYM SANG KUG | 3 | 2013–2014 |
| SHIN YOON-JAEself | 3 | 2012–2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Icheon-si, KR | 17 | 2012–2020 |
| Gyeonggi-do, KR | 15 | 2009–2017 |
| Kyungki-do, KR | 9 | 2008–2011 |
| Ichon-shi, KR | 3 | 2010–2011 |
| Ichon-si, KR | 1 | 2013 |