Inventor
Masahiko Nikaidou
Inventor
Tokyo, JP
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables40%
Y10TTechnical subjects covered by former us classification20%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light10%
H04BTransmission10%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1010%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1010%
PatentTitleYear
6,807,000'Gain measurement device for optical amplifier and method thereof'20046,400,168'Method for fabricating probe tip portion composed by coaxial cable'20026,281,691'Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable'20016,242,930'High-frequency probe capable of adjusting characteristic impedance in end part and having the end part detachable'20016,229,321'Process for manufacturing high frequency multichip module enabling independent test of bare chip'2001Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001–2004Patents assigned to NEC CORP (5)· patent assignee history
2001–2002Patents assigned to ANRITSU CORP (3)· patent assignee history
2001Patents assigned to ANTRITSU CORP (1)· patent assignee history
2001–2004Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NEC CORP | 5 | 2001–2004 |
| ANRITSU CORP | 3 | 2001–2002 |
| ANTRITSU CORP | 1 | 2001 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 5 | 2001–2004 |