Inventor

C. Patrick Doherty

Inventor

Boise, ID, US

Overview

16→

Patents

2000–2020

Patent span

Physics

Primary field (CPC G)

Patents· 16 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary

G01RMeasuring electric variables71%

Y10TTechnical subjects covered by former us classification14%

H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1010%

G10DStringed musical instruments5%

PatentTitleYear

10,643,588Drum tuning apparatus2020 7,250,780'Probe card for semiconductor wafers having mounting plate and socket'2007 6,853,211'Method and system having switching network for testing semiconductor components on a substrate'2005 6,798,224'Method for testing semiconductor wafers'2004 6,677,776'Method and system having switching network for testing semiconductor components on a substrate'2004 6,466,047'System for testing bumped semiconductor components with on-board multiplex circuit for expanding tester resources'2002 6,433,574'Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources'2002 6,366,112'Probe card having on-board multiplex circuitry for expanding tester resources'2002 6,359,456'Probe card and test system for semiconductor wafers'2002 6,356,098'Probe card, test method and test system for semiconductor wafers'2002 6,337,577'Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources'2002 6,300,786'Wafer test method with probe card having on-board multiplex circuitry for expanding tester resources'2001 6,275,052'Probe card and testing method for semiconductor wafers'2001 6,246,250'Probe card having on-board multiplex circuitry for expanding tester resources'2001 6,246,245'Probe card, test method and test system for semiconductor wafers'2001 6,060,891'Probe card for semiconductor wafers and method and system for testing wafers'2000

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2000–2007Patents assigned to MICRON TECHNOLOGY INC (15)· patent assignee history

2000–2007Based in Boise, ID, US· patent location history

2020Patents assigned to DOHERTY CONAN (1)· patent assignee history

2020Based in Water Mill, NY, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
MICRON TECHNOLOGY INC	15	2000–2007
DOHERTY CONANself	1	2020

Locations

Location	Patents	Span
Boise, ID, US	15	2000–2007
Water Mill, New York, US	1	2020