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Inventor

Shuji Toyonaga

Inventor
Shizuoka, JP

Overview

3→
Patents
1996–2000
Patent span
Physics
Primary field (CPC G)

Patents· 3 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions50%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light25%
G01NInvestigating or analysing materials by determining their chemical or physical properties25%
PatentTitleYear
6,025,917'Polarization characteristic measuring method and apparatus'20005,563,706'Interferometric surface profiler with an alignment optical member'19965,561,525'Interferometer for observing the interference pattern of a surface under test utilizing an adjustable aperture stop'1996

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1996Patents assigned to NIKON CORP (2)· patent assignee history
1996Based in Kanagawa, JP· patent location history
1996Based in Kawasaki, JP· patent location history
2000Patents assigned to LAB MOLECULAR BIOPHOTONICS (1)· patent assignee history
2000Based in Shizuoka, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
NIKON CORP21996
LAB MOLECULAR BIOPHOTONICS12000
Locations
LocationPatentsSpan
Shizuoka, JP12000
Kanagawa, JP11996
Kawasaki, JP11996