Inventor
Shoichi Yasukawa
Inventor
Hino, JP
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties63%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure25%
LOC2413%
PatentTitleYear
10,401,310X-ray stress analysis apparatus, method, and program20199,347,895'X-RAY diffraction apparatus, X-RAY diffraction measuring method, and control program'2016D0750783'X-ray residual stress measuring instrument'20168,953,743'X-ray stress measurement method and apparatus'20158,855,266'X-ray stress measurement apparatus'20147,342,995'Apparatus for estimating specific polymer crystal'2008Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2008–2019Patents assigned to RIGAKU DENKI CO LTD (6)· patent assignee history
2008Patents assigned to RIKEN (1)· patent assignee history
2008Based in Akishima, JP· patent location history
2014Patents assigned to IWATA TOMOYUKI (1)· patent assignee history
2014Patents assigned to YASUKAWA SHOICHI (1)· patent assignee history
2014–2019Based in Hino, JP· patent location history
2015–2016Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| RIGAKU DENKI CO LTD | 6 | 2008–2019 |
| IWATA TOMOYUKI | 1 | 2014 |
| RIKEN | 1 | 2008 |
| YASUKAWA SHOICHIself | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hino, JP | 3 | 2014–2019 |
| Tokyo, JP | 2 | 2015–2016 |
| Akishima, JP | 1 | 2008 |