Inventor
Masayuki Togawa
Inventor
Gifu, JP
Overview
Patents· 16 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Fprimary
H01FMagnets14%
H02KDynamo-electric machines14%
G01DMeasuring not specially adapted for a specific variable13%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests11%
Y10TTechnical subjects covered by former us classification11%
G02BOptical elements, systems or apparatus7%
G06KGraphical data reading5%
G08BSignalling systems, e.g. personal calling systems5%
G11BInformation storage based on relative movement between record carrier and transducer5%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein4%
PatentTitleYear
10,760,463Exhaust treatment device for diesel engine20207,561,799'Optical path switching device'20097,062,119'Optical device'20066,873,448'Optical path switching apparatus'20056,819,827'Optical path switching apparatus'20046,153,321'Method of using a substrate with magnetic substance of a magnetic scale'20006,072,174'Magneto-optically modulating system for monitoring relative relationship between an object and a magneto-optic effect element'20005,580,639'Method of manufacturing magnetic patterns'19965,527,663'Method of manufacturing a medium having a magnetic pattern'19965,445,707'Method of manufacturing article having magnetic patterns'19955,434,934'Magneto-optically modulating system'19955,429,911'Method of manufacturing a medium having a magnetic pattern'19955,427,675'Method of manufacturing article having magnetic patterns'19955,350,618'Magnetic medium comprising a substrate having pits and grooves of specific shapes and depths'19945,336,586'Magnetic medium and method of manufacturing the same'19945,281,912'Magneto-optic magnetic-field measuring apparatus for measuring a magnetic field intensity by measuring an angle of diffraction'1994Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1994–2006Patents assigned to TEIJIN SEIKI CO LTD (12)· patent assignee history
1994–2000Based in Gifu, JP· patent location history
1995Patents assigned to TEIJIN SEIKO CO LTD (1)· patent assignee history
2000Patents assigned to TEIJUN SEIKI CO (1)· patent assignee history
2000–2004Based in Yokohama, JP· patent location history
2005–2006Based in Kanagawa, JP· patent location history
2009Patents assigned to NABTESCO CORP (1)· patent assignee history
2009Based in Tokyo, JP· patent location history
2020Patents assigned to KUBOTA KK (1)· patent assignee history
2020Based in Sakai, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TEIJIN SEIKI CO LTD | 12 | 1994–2006 |
| KUBOTA KK | 1 | 2020 |
| NABTESCO CORP | 1 | 2009 |
| TEIJIN SEIKO CO LTD | 1 | 1995 |
| TEIJUN SEIKI CO | 1 | 2000 |
Locations
| Location | Patents | Span |
|---|---|---|
| Gifu, JP | 9 | 1994–2000 |
| Kanagawa, JP | 2 | 2005–2006 |
| Yokohama, JP | 2 | 2000–2004 |
| Sakai, JP | 1 | 2020 |
| Tokyo, JP | 1 | 2009 |