Inventor
Yutaka Tandai
Inventor
Tokyo, JP
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Tprimary
G06TImage data processing or generation, in general24%
G01NInvestigating or analysing materials by determining their chemical or physical properties18%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1018%
H01JElectric discharge tubes or discharge lamps12%
H01LSemiconductor devices12%
G06FElectric digital data processing6%
G06KGraphical data reading6%
G06VImage or video recognition or understanding6%
PatentTitleYear
10,304,654Charged particle beam device201910,074,511Defect image classification apparatus20189,881,365'Semiconductor defect categorization device and program for semiconductor defect categorization device'20188,995,748'Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying method'20158,595,666'Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying program'20138,139,845'Evaluation object pattern determining apparatus, evaluation object pattern determining method, evaluation object pattern determining program and pattern evaluating system'2012Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2012–2019Patents assigned to HITACHI HIGH TECH CORP (6)· patent assignee history
2012–2015Patents assigned to ISHIKAWA TAMAO (3)· patent assignee history
2012–2015Patents assigned to TANDAI YUTAKA (3)· patent assignee history
2012–2015Patents assigned to KURIHARA SHIGEKI (2)· patent assignee history
2012–2015Based in Hitachinaka, JP· patent location history
2013–2015Patents assigned to ICHINOSE KATSUHIKO (2)· patent assignee history
2018–2019Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 6 | 2012–2019 |
| ISHIKAWA TAMAO | 3 | 2012–2015 |
| TANDAI YUTAKAself | 3 | 2012–2015 |
| ICHINOSE KATSUHIKO | 2 | 2013–2015 |
| KURIHARA SHIGEKI | 2 | 2012–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 3 | 2018–2019 |
| Hitachinaka, JP | 3 | 2012–2015 |