Inventor
Tsuneyuki Urakami
Inventor
Hamamatsu, JP
Overview
Patents· 26 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables19%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light16%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light16%
G01NInvestigating or analysing materials by determining their chemical or physical properties8%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein8%
A61BDiagnosis5%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%
G02BOptical elements, systems or apparatus3%
G04FTime-interval measuring3%
G06EOptical computing devices3%
PatentTitleYear
6,567,165'Concentration measuring method and apparatus for absorption component in scattering medium'20035,811,805'Charged particle guide apparatus and image viewing apparatus for charged particle microscope using the same'19985,774,223'Optical measuring method and an optical measuring apparatus for determining the internal structure of an object'19985,703,491'Voltage detection apparatus'19975,640,247'Method for measuring internal information in a scattering medium and apparatus for the same'19975,583,444'Voltage detection apparatus'19965,499,190'System for measuring timing relationship between two signals'19965,491,329'Photodetecting apparatus having intensity tuneable light irradiating unit'19965,444,365'Voltage measuring apparatus having an electro-optic member'19955,420,686'Polarization interferometer optical voltage detector utilizing movement of interference fringe'19955,384,638'Sampling-type optical voltage detector utilizing movement of interference fringe'19955,353,149'Apparatus for affecting time-space conversion on a light signal changing at ultra-high speed'19945,319,654'Pulsed laser beam source device'19945,317,577'Optical wavelength shifter using nonlinear refractive medium disposed interiorly of laser resonator'19945,307,199'Optical apparatus'19945,274,651'Optical modulator with nonlinear medium disposed interiorly of laser resonator'19935,237,388'Polarized light measuring apparatus and phase plate measuring apparatus'19935,220,579'Pulse laser'19935,198,921'Light amplifying polarizer'19935,168,164'Optical waveform measuring device'19925,124,551'Apparatus for measuring the temporal correlation of fundamental particles'19925,025,142'Light waveform changing apparatus using an optical amplifier'19914,994,663'Light intensity correlating apparatus'19914,980,632'Electrical signal observing device'19904,967,080'Apparatus for measuring the temporal correlation of fundamental particles'19904,958,354'Apparatus for stabilizing the intensity of light'1990Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1990–2003Patents assigned to HAMAMATSU PHOTONICS KK (26)· patent assignee history
1990–1995Based in Shizuoka, JP· patent location history
1992–2003Based in Hamamatsu, JP· patent location history
1996–1998Based in Mori-machi, JP· patent location history
1998Patents assigned to HITACHI LTD (1)· patent assignee history
1998Patents assigned to JAPAN RES DEV CORP (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HAMAMATSU PHOTONICS KK | 26 | 1990–2003 |
| HITACHI LTD | 1 | 1998 |
| JAPAN RES DEV CORP | 1 | 1998 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hamamatsu, JP | 13 | 1992–2003 |
| Shizuoka, JP | 10 | 1990–1995 |
| Mori-machi, JP | 3 | 1996–1998 |