Inventor

Masayuki Itoh

Inventor
Kawasaki, JP

Overview

81→
Patents
1981–2021
Patent span
Electricity
Primary field (CPC H)

Patents· 81 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

Y10Tprimary
Y10TTechnical subjects covered by former us classification12%
H03HImpedance networks, e.g. resonant circuits8%
H01LSemiconductor devices7%
H03BGeneration of oscillations, directly or by frequency-changing, by circuits employing active elements which operate in a non-switching manner6%
H01GCapacitors5%
H05KPrinted circuits5%
H01FMagnets4%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h104%
H10NElectric solid-state devices not otherwise provided for4%
G01RMeasuring electric variables3%
PatentTitleYear
11,071,999Effect pigment dispersion202111,052,777Method of charging electric autonomous moving body202111,043,128Merging support information distribution apparatus, merging support system, merging support information distribution method, and computer program202111,036,809Trouble information search method and trouble information search apparatus202110,875,415Method of charging electric autonomous moving body202010,644,672Crystal unit and method of adjusting crystal unit202010,629,371Method of manufacturing coil component202010,610,889Multi-layer coating film formation method202010,614,189Component retrieve device and component retrieve method202010,476,435Crystal oscillator, crystal resonator controlling method, and crystal resonator controlling device201910,453,606Manufacturing method of transformer device201910,395,832Electronic component and component-embedded substrate201910,355,641Crystal oscillator device and method of measuring crystal oscillator characteristic201910,355,640Crystal oscillator device and method of measuring crystal oscillator characteristic201910,340,850Crystal oscillator device and method of measuring crystal oscillator characteristic201910,333,480Crystal oscillator device and method of measuring crystal oscillator characteristic201910,283,270Electronic component and component-embedded substrate201910,267,755Method for inspecting crystal unit by analyzing frequency characteristics of impedance201910,256,771Crystal oscillator device and method of measuring crystal oscillator characteristic201910,102,957Method for manufacturing transformer apparatus201810,090,110Crystal unit and method of adjusting crystal unit201810,029,173Training system and training method201810,028,387Electronic part bonding substrate201810,018,776Illumination device, illumination equipment, and display device20189,929,692'Crystal unit, oscillator, and method for fabricating the crystal unit'20189,921,257'Crystal unit'20189,892,852'Inductor manufacturing method'20189,865,396'Method of manufacturing capacitor including intermediate dielectric layer with first internal electrodes and second internal electrodes'20189,853,627Crystal resonator, and production method therefor20179,812,257'Coil component and method of manufacturing coil component'20179,778,096'Method of measuring characteristics of crystal unit'20179,774,296'Crystal unit, oscillator, and method for fabricating the crystal unit'20179,704,834'Method for manufacturing light-emitting device'20179,570,223'Transformer apparatus and method for manufacturing transformer apparatus'20179,541,602'Electronic component inspection apparatus and method'20179,545,044'Electronic component assembly apparatus'20179,536,661'Method of production of transformer module'20179,524,819'Transformer device and manufacturing method thereof'20169,464,943'Temperature sensor and temperature compensation oscillator'20169,410,997'Crystal unit and method of measuring characteristics of the crystal unit'20169,407,371'Optical multiplexer/demultiplexer'20169,384,900'Electronic component and manufacturing method thereof'20169,307,686'Electronic component and electronic component assembly apparatus'20169,287,843'Method of fabricating crystal unit, crystal unit fabrication mask, and crystal unit package'20169,209,781'Oscillator device and method of mounting oscillator device'20159,208,951'Capacitor and method of manufacturing capacitor'20159,190,215'Electrolytic capacitor and method of manufacturing the same'20159,054,311'Electronic device and method of manufacturing the same'20158,968,498'Crystal-oscillator fabricating apparatus and method'20158,931,165'Method of manufacturing coil device'20158,859,334'Electronic device manufacturing method and chip assembly'20148,729,777'Piezoelectric oscillator'20148,723,391'Tuning fork vibrator with support arms extending obliquely from the base'20148,710,710'Method of fabricating crystal unit, crystal unit fabrication mask, and crystal unit package'20148,629,601'Piezoelectric oscillator'20148,547,180'Package, piezoelectric vibrator and piezoelectric oscillator'20138,446,708'Solid electrolytic capacitor and power circuit'20138,440,481'Manufacturing method of the electronic component'20138,393,071'Method for manufacturing an oscillator device'20138,344,915'Keyboard and information processing device'20138,196,278'Method for taking an electronic component out of a carrier tape'20128,093,616'Electronic component, manufacturing method of the electronic component, electronic component assembly body, and electronic device'20127,602,600'Tantalum capacitor'20097,586,737'Electronic component and lead unit therefor'20097,547,412'Composite material, method for producing same and member using same'20097,298,605'Electrolytic capacitor'20076,967,065'Separator of proton exchange fuel cell and its manufacturing method'20056,595,821'Rotary anode for X-ray tube comprising an Mo-containing layer and a W-containing layer laminated to each other and method of producing the same'20036,398,503'High temperature component, gas turbine high temperature component and manufacturing method thereof'20026,348,232'Spraying robot system and spraying method wherein spray conditions are determined by using computer'20026,233,311'Rotary anode for X-ray tube comprising an Mo-containing layer and a W-containing layer laminated to each other and method of producing the same'20016,058,486'Timing generator for plural reference clock frequencies'20005,903,745'Timing generator for plural reference clocks'19995,761,100'Period generator for semiconductor testing apparatus'19985,579,534'Heat-resistant member'19964,774,150'Thermal barrier coating'19884,542,730'Method and apparatus for controlling air-fuel ratio of mixture for combustion engines'19854,528,246'Shadow mask'19854,517,158'Alloy with constant modulus of elasticity'19854,385,826'Toner image fixing device'19834,253,873'Titanium-based alloy having high mechanical strength'1981

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1981–2021Based in Kawasaki, JP· patent location history
1988–2005Patents assigned to TOSHIBA KK (5)· patent assignee history
1998–2000Based in Kazo, JP· patent location history
2007–2021Patents assigned to FUJITSU LTD (56)· patent assignee history
2012–2016Patents assigned to ITOH MASAYUKI (12)· patent assignee history
2013–2015Patents assigned to KISHI MASAKAZU (6)· patent assignee history
2013–2015Patents assigned to KUBOTA HAJIME (6)· patent assignee history
2017–2018Based in Osaka, JP· patent location history
2020–2021Based in Aichi, JP· patent location history
2020–2021Based in Nagoya, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
FUJITSU LTD562007–2021
ITOH MASAYUKIself122012–2016
KISHI MASAKAZU62013–2015
KUBOTA HAJIME62013–2015
TOSHIBA KK51988–2005
Locations
LocationPatentsSpan
Kawasaki, JP621981–2021
Kazo, JP31998–2000
Aichi, JP22020–2021
Nagoya, JP22020–2021
Osaka, JP22017–2018