Inventor
CHRIS BEVIS
Inventor
US
Overview
Patents· 3 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties20%
G01QScanning-probe techniques or apparatus20%
H01JElectric discharge tubes or discharge lamps20%
H01LSemiconductor devices20%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1020%
PatentTitleYear
12,165,863Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry202411,764,050Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry202311,430,647Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2024Patents assigned to NOVA MEASURING INSTR INC (3)· patent assignee history
2022–2024Based in US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NOVA MEASURING INSTR INC | 3 | 2022–2024 |
Locations
| Location | Patents | Span |
|---|---|---|
| US | 3 | 2022–2024 |