Inventor
Yannan Jin
Inventor
Schenectady, NY, US
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
A61Bprimary
A61BDiagnosis33%
G01TMeasurement of nuclear or x-radiation22%
G06TImage data processing or generation, in general17%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
G01VGeophysics4%
G16HHealthcare informatics, i.e. information and communication technology [ict] specially adapted for the handling or processing of medical or healthcare data4%
G21KHandling of particles or ionising radiation not otherwise provided for4%
D06FLaundering, drying, ironing, pressing or folding textile articles2%
F16DCouplings for transmitting rotation2%
H02KDynamo-electric machines2%
PatentTitleYear
11,015,279Clutch assembly of washing machine202110,827,992Energy-discriminating photon-counting detector and the use thereof202010,779,778Reference detector elements in conjunction with an anti-scatter collimator202010,679,385System and method for statistical iterative reconstruction and material decomposition202010,631,815Scatter correction technique for use with a radiation detector202010,610,173System and method to improve spatial resolution in computed tomography202010,595,803Signal processing method and imaging system for scatter correction in computed tomography202010,571,579Dual-mode radiation detector202010,507,005Spectral calibration of spectral computed tomography (CT)201910,398,394Energy-discriminating photon-counting detector and the use thereof201910,222,489Pixel-design for use in a radiation detector201910,213,172Imaging method and system of tube voltage and current optimization201910,162,066Coincidence-enabling photon-counting detector201810,117,626Apparatus and method for pile-up correction in photon-counting detector20189,888,894'Multi-energy X-ray imaging'20189,655,580'Systems and methods for metal artifact reduction'20179,374,565'System and method for multi-material correction of image data'20169,320,481'Systems and methods for X-ray imaging'20169,220,469'Systems and methods for correcting detector errors in computed tomography imaging'20159,025,815'System and method for multi-material correction of image data'2015Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2015–2020Patents assigned to GEN ELECTRIC (19)· patent assignee history
2015–2020Based in Schenectady, NY, US· patent location history
2016–2020Based in Niskayuna, NY, US· patent location history
2021Patents assigned to SAMSUNG ELECTRONICS CO LTD (1)· patent assignee history
2021Based in Suwon-si, KR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 19 | 2015–2020 |
| SAMSUNG ELECTRONICS CO LTD | 1 | 2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| Schenectady, New York, US | 11 | 2015–2020 |
| Niskayuna, New York, US | 8 | 2016–2020 |
| Suwon-si, KR | 1 | 2021 |