Inventor
Kenji Terao
Inventor
Tokyo, JP
Overview
Patents· 23 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps27%
G01NInvestigating or analysing materials by determining their chemical or physical properties16%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
H01LSemiconductor devices7%
H04BTransmission7%
C30BSingle-crystal growth4%
G01RMeasuring electric variables4%
H02JElectric power networks4%
H03GControl of amplification4%
Y10TTechnical subjects covered by former us classification4%
PatentTitleYear
10,734,827Power supply system202010,446,404Electron-beam irradiated area adjustment method and adjustment system, electron-beam irradiated region correction method, and electron beam irradiation apparatus201910,002,740Inspection device20189,966,227Specimen observation method and device using secondary emission electron and mirror electron detection20189,852,878Surface processing apparatus20179,194,826'Electron beam apparatus and sample observation method using the same'20159,105,444'Electro-optical inspection apparatus and method with dust or particle collection function'20158,937,283'Specimen observation method and device using secondary emission electron and mirror electron detection'20158,859,984'Method and apparatus for inspecting sample surface'20148,624,182'Electro-optical inspection apparatus and method with dust or particle collection function'20148,525,127'Method and apparatus for inspecting sample surface'20138,274,047'Substrate surface inspection method and inspection apparatus'20128,148,924'Electrical motor load controller and control methods therefor'20127,952,071'Apparatus and method for inspecting sample surface'20117,829,853'Sample surface observation method'20107,496,163'AGC system, AGC method, and receiver using the AGC system'20097,366,263'Radio communication terminal and radio signal receiving method'20087,256,405'Sample repairing apparatus, a sample repairing method and a device manufacturing method using the same method'20077,254,162'CDMA receiver performing a path search, path search method, and program therefor'20077,039,097'CDMA receiver, path search method and program'20066,663,710'Method for continuously pulling up crystal'20036,471,768'Method of and apparatus for growing ribbon of crystal'20025,539,538'Facsimile machine having a single feeding path for document and recording sheet'1996Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2002–2019Patents assigned to EBARA CORP (16)· patent assignee history
2003–2019Based in Tokyo, JP· patent location history
2012–2015Patents assigned to TERAO KENJI (7)· patent assignee history
2012–2015Patents assigned to HATAKEYAMA MASAHIRO (6)· patent assignee history
2012–2015Patents assigned to NAITO YOSHIHIKO (6)· patent assignee history
2012–2015Patents assigned to KIMURA NORIO (4)· patent assignee history
2012Based in Chiryu, JP· patent location history
2013–2014Based in Saitama-shi, JP· patent location history
2014Based in Tokyp, JP· patent location history
2020Based in Motosu-gun, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| EBARA CORP | 16 | 2002–2019 |
| TERAO KENJIself | 7 | 2012–2015 |
| HATAKEYAMA MASAHIRO | 6 | 2012–2015 |
| NAITO YOSHIHIKO | 6 | 2012–2015 |
| KIMURA NORIO | 4 | 2012–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 15 | 2003–2019 |
| Saitama-shi, JP | 2 | 2013–2014 |
| Motosu-gun, JP | 1 | 2020 |
| Tokyp, JP | 1 | 2014 |
| Chiryu, JP | 1 | 2012 |