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Inventor

Julius Schlesinger

Inventor
Deer Park, NY, US

Overview

2→
Patents
1978–1979
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions67%
G01NInvestigating or analysing materials by determining their chemical or physical properties33%
PatentTitleYear
4,155,009'Thickness measurement instrument with memory storage of multiple calibrations'19794,079,237'Card controlled beta backscatter thickness measuring instrument'1978

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1978–1979Patents assigned to UNIT PROCESS ASSEMBLIES (2)· patent assignee history
1978–1979Based in Deer Park, NY, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
UNIT PROCESS ASSEMBLIES21978–1979
Locations
LocationPatentsSpan
Deer Park, New York, US21978–1979