Inventor
Craig E. Schneider
Inventor
Underhill, VT, US
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores37%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices16%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them11%
G05BControl or regulating systems in general11%
H01LSemiconductor devices11%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
Y02PClimate change mitigation technologies in the production or processing of goods5%
PatentTitleYear
9,576,863'Method of fine-tuning process controls during integrated circuit chip manufacturing based on substrate backside roughness'20179,330,988'Method of fine-tuning process controls during integrated circuit chip manufacturing based on substrate backside roughness'20166,965,808'System and method for optimizing metrology sampling in APC applications'20056,922,600'System and method for optimizing manufacturing processes using real time partitioned process capability analysis'20056,856,378'Method of photolithographic exposure dose control as a function of resist sensitivity'20056,674,516'Method of photolithographic exposure dose control as a function of resist sensitivity'20046,557,163'Method of photolithographic critical dimension control by using reticle measurements in a control algorithm'20036,172,924'Memory device with a sense amplifier'20016,058,058'Memory device with a sense amplifier'20005,940,338'Memory device with a sense amplifier'19995,901,099'Memory device with a sense amplifier'19995,812,470'Apparatus, system and method for identifying semiconductor memory access modes'19985,744,978'Variable load device responsive to a circuit parameter'19985,627,785'Memory device with a sense amplifier'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997–2001Patents assigned to MICRON TECHNOLOGY INC (7)· patent assignee history
1997–2001Based in Boise, ID, US· patent location history
2003–2017Patents assigned to IBM (7)· patent assignee history
2003–2017Based in Underhill, VT, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 7 | 2003–2017 |
| MICRON TECHNOLOGY INC | 7 | 1997–2001 |
Locations
| Location | Patents | Span |
|---|---|---|
| Underhill, VT, US | 7 | 2003–2017 |
| Boise, ID, US | 7 | 1997–2001 |