Inventor
Alex Tokar
Inventor
Haifa, IL
Overview
Patents· 7 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties55%
H01LSemiconductor devices18%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1018%
G01BMeasuring length, thickness or similar linear dimensions9%
PatentTitleYear
9,829,448Measurement of small features using XRF20179,632,043'Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-XRF'20179,389,192'Estimation of XRF intensity from an array of micro-bumps'20169,390,984'X-ray inspection of bumps on a semiconductor substrate'20167,649,978'Automated selection of X-ray reflectometry measurement locations'20107,321,652'Multi-detector EDXRD'20087,245,695'Detection of dishing and tilting using X-ray fluorescence'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007Patents assigned to JORDAN VALLEY APPLIED RADIATION LTD (1)· patent assignee history
2007–2017Based in Haifa, IL· patent location history
2008–2016Patents assigned to JORDAN VALLEY SEMICONDUCTORS (4)· patent assignee history
2016–2017Patents assigned to BRUKER JV ISRAEL LTD (4)· patent assignee history
2017Patents assigned to JORDAN VALLEY SEMICONDUCTORS LTD (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| BRUKER JV ISRAEL LTD | 4 | 2016–2017 |
| JORDAN VALLEY SEMICONDUCTORS | 4 | 2008–2016 |
| JORDAN VALLEY SEMICONDUCTORS LTD | 2 | 2017 |
| JORDAN VALLEY APPLIED RADIATION LTD | 1 | 2007 |
Locations
| Location | Patents | Span |
|---|---|---|
| Haifa, IL | 7 | 2007–2017 |