Inventor

Takeshi Ozeki

Inventor
Tokyo, JP

Overview

35→
Patents
1980–2020
Patent span
Physics
Primary field (CPC G)

Patents· 35 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G02Bprimary
G02BOptical elements, systems or apparatus12%
LOC1512%
H04BTransmission6%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests6%
G01DMeasuring not specially adapted for a specific variable4%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light4%
G01KMeasuring temperature4%
G01MTesting static or dynamic balance of machines or structures4%
G06FElectric digital data processing4%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light4%
PatentTitleYear
D0875205Filling nozzle2020D0866282Nozzle hook2019D0860259Gas filling apparatus2019D0849058Gas filling apparatus2019D0829119Flowmeter201810,012,349Liquefied natural gas filling device2018D0814526Main body of gas filling apparatus2018D0813913'Gas filling apparatus'2018D0809569'Gas filling apparatus'2018D0809568'Gas filling apparatus'20189,751,125'Method of manufacturing a gear'20177,046,366'Apparatus, method, and program for measuring optical characteristic using quantum interference, and recording medium for recording the program'20067,006,207'Polarization mode dispersion measuring device, method, recording medium'20065,717,489'Polarization mode dispersion measuring instrument and method'19985,615,112'Synthesized object-oriented entity-relationship (SOOER) model for coupled knowledge-base/database of image retrieval expert system (IRES)'19975,390,017'Optical network analyzer for measuring the amplitude characteristics and group delay time dispersion characteristics of an optical circuit device'19955,276,439'Digital signal exchange equipment'19945,259,048'Optical equalizer'19935,121,384'Integrated multimedia network system'19925,061,937'Array antenna apparatus'19914,954,786'Optical amplifying device'19904,876,643'Parallel searching system having a master processor for controlling plural slave processors for independently processing respective search requests'19894,704,715'Information communication system'19874,674,046'Method and apparatus for obtaining three dimensional tomographic images by interpolation of a plurality of projection slice data bind for obtaining projection data for a chosen slice'19874,605,943'Composite optical semiconductor device'19864,584,678'Contention-type data communication system'19864,581,730'Optical instrumentation method and device'19864,539,476'Module for a fiber optic link'19854,511,208'Optical communication system'19854,400,055'Optical power distributor and method for manufacturing the same'19834,392,712'Light distributor'19834,385,386'Laser apparatus'19834,368,981'Optical sensing system'19834,334,781'Optical sensing system'19824,232,385'Frequency division multiplexing system for optical transmission of broadband signals'1980

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1980–2020Based in Tokyo, JP· patent location history
1982–1986Patents assigned to TOKYO SHIBAURA ELECTRIC CO (8)· patent assignee history
1986–1995Patents assigned to TOSHIBA KK (10)· patent assignee history
1986Patents assigned to AGENCY IND SCIENCE TECHN (1)· patent assignee history
1990–2006Based in Saitama, JP· patent location history
1991–1994Based in Kawaguchi, JP· patent location history
1998–2006Patents assigned to ADVANTEST CORP (3)· patent assignee history
1998Based in Saitama-shi, JP· patent location history
2017Based in Mooka, JP· patent location history
2018–2020Patents assigned to TATSUNO CORP (10)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TATSUNO CORP102018–2020
TOSHIBA KK101986–1995
TOKYO SHIBAURA ELECTRIC CO81982–1986
ADVANTEST CORP31998–2006
AGENCY IND SCIENCE TECHN11986
Locations
LocationPatentsSpan
Tokyo, JP221980–2020
Kawaguchi, JP41991–1994
Saitama, JP31990–2006
Mooka, JP12017
Saitama-shi, JP11998