Inventor

Dinesh Nair

Inventor

Austin, TX, US

Overview

2000–2019

Patent span

Physics

Primary field (CPC G)

Patents· 41 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G06Vprimary

G06VImage or video recognition or understanding37%

G06TImage data processing or generation, in general24%

G06FElectric digital data processing18%

G05BControl or regulating systems in general6%

Y02PClimate change mitigation technologies in the production or processing of goods4%

G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes3%

G01NInvestigating or analysing materials by determining their chemical or physical properties2%

Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests2%

G01BMeasuring length, thickness or similar linear dimensions1%

G11BInformation storage based on relative movement between record carrier and transducer1%

PatentTitleYear

10,235,477Prototyping an image processing algorithm and emulating or simulating execution on a hardware accelerator to estimate resource usage or performance2019 8,879,848'Machine vision based automatic maximal clamp measurement tool'2014 8,457,414'Detection of textural defects using a one class support vector machine'2013 8,068,660'Characterizing vision systems'2011 7,937,665'System and method for automatically generating a graphical program to implement a prototype'2011 7,397,956'Pattern matching method selection'2008 7,340,089'Geometric pattern matching using dynamic feature combinations'2008 7,233,700'System and method for signal matching and characterization'2007 7,233,699'Pattern matching using multiple techniques'2007 7,171,048'Pattern matching system utilizing discrete curve matching with a mapping operator'2007 7,158,677'Matching of discrete curves under affine transforms'2007 7,139,432'Image pattern matching utilizing discrete curve matching with a mapping operator'2006 7,136,505'Generating a curve matching mapping operator by analyzing objects of interest and background information'2006 7,133,538'Pattern matching utilizing discrete curve matching with multiple mapping operators'2006 7,127,100'System and method for analyzing an image'2006 7,120,301'Efficient re-sampling of discrete curves'2006 7,046,842'System and method for color characterization using fuzzy pixel classification with application in color matching and color match location'2006 7,039,229'Locating regions in a target image using color match, luminance pattern match and hill-climbing techniques'2006 7,034,831'System and method for generating a low discrepancy curve in a region'2006 7,013,047'System and method for performing edge detection in an image'2006 6,963,425'System and method for locating color and pattern match regions in a target image'2005 6,963,667'System and method for signal matching and characterization'2005 6,959,104'System and method for scanning a region using a low discrepancy sequence'2005 6,950,552'System and method for precise location of a point of interest'2005 6,944,331'Locating regions in a target image using color matching, luminance pattern matching and hue plane pattern matching'2005 6,917,710'System and method for scanning a region using a low discrepancy curve'2005 6,909,801'System and method for generating a low discrepancy curve on an abstract surface'2005 6,882,958'System and method for curve fitting using randomized techniques'2005 6,820,032'System and method for scanning a region using conformal mapping'2004 6,807,305'System and method for image pattern matching using a unified signal transform'2004 6,763,515'System and method for automatically generating a graphical program to perform an image processing algorithm'2004 6,757,428'System and method for color characterization with applications in color measurement and color matching'2004 6,681,057'Image registration system and method implementing PID control techniques'2004 6,665,066'Machine vision system and method for analyzing illumination lines in an image to determine characteristics of an object being inspected'2003 6,615,158'System and method for analyzing a surface by mapping sample points onto the surface and sampling the surface at the mapped points'2003 6,535,640'Signal analysis system and method for determining a closest vector from a vector collection to an input signal'2003 6,370,270'System and method for sampling and/or placing objects using low discrepancy sequences'2002 6,229,921'Pattern matching system and method with improved template image sampling using low discrepancy sequences'2001 6,222,940'Pattern matching system and method which detects rotated and scaled template images'2001 6,219,452'Pattern matching system and method which performs local stability analysis for improved efficiency'2001 6,049,363'Object detection method and system for scene change analysis in TV and IR data'2000

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2000–2014Based in Austin, TX, US· patent location history

2001–2014Patents assigned to NAT INSTR CORP (38)· patent assignee history

2011–2014Patents assigned to NAIR DINESH R (2)· patent assignee history

2011–2014Patents assigned to VAZQUEZ NICOLAS (2)· patent assignee history

2013Patents assigned to BOVIK ALAN C (1)· patent assignee history

2014Patents assigned to BAGARIA VENKATESH (1)· patent assignee history

2019Based in Bangalore, IN· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
NAT INSTR CORP	38	2001–2014
NAIR DINESH Rself	2	2011–2014
VAZQUEZ NICOLAS	2	2011–2014
BAGARIA VENKATESH	1	2014
BOVIK ALAN C	1	2013

Locations

Location	Patents	Span
Austin, Texas, US	40	2000–2014
Bangalore, IN	1	2019