Inventor

Kenneth Gilbert Roessler

Inventor

Boca Raton, FL, US

Overview

1993–2021

Patent span

Physics

Primary field (CPC G)

Patents· 31 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

Y10Sprimary

Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests23%

G01QScanning-probe techniques or apparatus20%

B08BCleaning in general16%

G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices16%

B82YSpecific uses or applications of nanostructures10%

G01RMeasuring electric variables4%

B03CMagnetic or electrostatic separation of solid materials from solid materials or fluids2%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h102%

B23QDetails, components, or accessories for machine tools, e.g. arrangements for copying or controlling1%

B81CProcesses or apparatus specially adapted for the manufacture or treatment of microstructural devices or systems1%

PatentTitleYear

11,040,379Debris removal in high aspect structures2021 10,384,238Debris removal in high aspect structures2019 10,330,581Debris removal from high aspect structures2019 9,588,420'Apparatus and method for indirect surface cleaning'2017 9,285,674'Apparatus and method for indirect surface cleaning'2016 8,986,460'Apparatus and method for indirect surface cleaning'2015 8,741,067'Apparatus and method for indirect surface cleaning'2014 8,696,818'Debris removal in high aspect structures'2014 8,613,803'Apparatus and method for indirect surface cleaning'2013 8,562,749'Wafer fabrication process'2013 8,293,019'Apparatus and method for indirect surface cleaning'2012 8,287,653'Debris removal in high aspect structures'2012 8,182,609'Apparatus and method for direct surface cleaning'2012 7,993,464'Apparatus and method for indirect surface cleaning'2011 7,829,360'Vertical indent production repair'2010 7,547,882'Scan data collection for better overall data accurancy'2009 7,053,369'Scan data collection for better overall data accuracy'2006 6,318,159'Scanning force microscope with automatic surface engagement'2001 6,234,009'Controlling motion of a scanning force microscope probe tip moving into engagement with a sample surface'2001 6,220,084'Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope'2001 6,167,753'Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope'2001 6,169,281'Apparatus and method for determining side wall profiles using a scanning probe microscope having a probe dithered in lateral directions'2001 6,079,254'Scanning force microscope with automatic surface engagement and improved amplitude demodulation'2000 5,918,274'Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope'1999 5,902,928'Controlling engagement of a scanning microscope probe with a segmented piezoelectric actuator'1999 5,801,381'Method for protecting a probe tip using active lateral scanning control'1998 5,773,824'Method for improving measurement accuracy using active lateral scanning control of a probe'1998 5,635,848'Method and system for controlling high-speed probe actuators'1997 5,360,974'Dual quad flexure scanner'1994 5,262,643'Automatic tip approach method and apparatus for scanning probe microscope'1993 5,260,577'Sample carriage for scanning probe microscope'1993

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1993–2001Patents assigned to IBM (14)· patent assignee history

1993–2021Based in Boca Raton, FL, US· patent location history

2006–2019Patents assigned to RAVE LLC (16)· patent assignee history

2012–2013Patents assigned to BRINKLEY DAVID (3)· patent assignee history

2012–2013Patents assigned to ROESSLER KENNETH G (3)· patent assignee history

2012–2013Patents assigned to LECLAIRE JEFFREY E (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
RAVE LLC	16	2006–2019
IBM	14	1993–2001
BRINKLEY DAVID	3	2012–2013
ROESSLER KENNETH Gself	3	2012–2013
LECLAIRE JEFFREY E	2	2012–2013

Locations

Location	Patents	Span
Boca Raton, Florida, US	31	1993–2021