Inventor
Lewis A. Binns
Inventor
York, GB
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices100%
PatentTitleYear
8,339,605'Multilayer alignment and overlay target and measurement method'20128,107,079'Multi layer alignment and overlay target and measurement method'20127,876,439'Multi layer alignment and overlay target and measurement method'20117,473,502'Imaging tool calibration artifact and method'20097,474,401'Multi-layer alignment and overlay target and measurement method'2009Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2009–2012Patents assigned to IBM (5)· patent assignee history
2009–2012Patents assigned to NANOMETRICS INC (3)· patent assignee history
2009–2012Based in York, GB· patent location history
2012Patents assigned to AUSSCHNITT CHRISTOPHER P (2)· patent assignee history
2012Patents assigned to BINNS LEWIS A (2)· patent assignee history
2012Patents assigned to MORILLO JAIME D (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 5 | 2009–2012 |
| NANOMETRICS INC | 3 | 2009–2012 |
| AUSSCHNITT CHRISTOPHER P | 2 | 2012 |
| BINNS LEWIS Aself | 2 | 2012 |
| MORILLO JAIME D | 2 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| York, GB | 5 | 2009–2012 |