Inventor
Hiroshi Murase
Inventor
Tokyo, JP
Overview
Patents· 42 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H04Nprimary
H04NPictorial communication, e.g. television12%
G09GArrangements or circuits for control of indicating devices using static means to present variable information8%
G06FElectric digital data processing6%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h106%
G01RMeasuring electric variables6%
G06VImage or video recognition or understanding6%
G06TImage data processing or generation, in general5%
G01MTesting static or dynamic balance of machines or structures4%
G01KMeasuring temperature3%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein3%
PatentTitleYear
10,970,825Image processing method and image processing apparatus for executing image processing method202110,909,717Viewpoint recommendation apparatus, recommendation method thereof, and non-transitory computer readable medium202110,803,782Unevenness correction data generation method and unevenness correction data generation system202010,699,106Direction discrimination device and direction discrimination method202010,436,637Unevenness evaluation method and unevenness evaluation apparatus201910,339,405Image recognition device and image recognition method201910,145,538Light-emitting apparatus, calibration coefficient calculation method, and method for calibrating captured image of examination target item201810,015,373Image processing method and image processing apparatus for executing image processing method20189,554,044'Image quality adjustment apparatus, correction data generation method, and image quality adjustment technique using the apparatus and method'20179,277,209'Pattern position detection method, pattern position detection system, and image quality adjustment technique using the method and system'20168,941,742'Luminance measurement method, luminance measurement device, and image quality adjustment technique using the method and device'20158,866,914'Pattern position detection method, pattern position detection system, and image quality adjustment technique using the method and system'20148,786,712'Luminance measurement method, luminance measurement device, and image quality adjustment technique using the method and device'20147,797,160'Signal compression method, device, program, and recording medium; and signal retrieval method, device, program, and recording medium'20107,777,288'Integrated circuit device and fabrication method therefor'20107,756,298'Image processing device for vehicle'20107,741,692'Integrated circuit device with temperature monitor members'20107,577,334'High-speed signal search method, device, and recording medium for the same'20097,551,834'High-speed signal search method, device, and recording medium for the same'20097,546,672'Methods for manufacturing a motor'20097,490,107'Information search method and apparatus of time-series data using multi-dimensional time-series feature vector and program storage medium'20097,462,921'Integrated circuit device, method of manufacturing the same and method of forming vanadium oxide film'20087,391,092'Integrated circuit including a temperature monitor element and thermal conducting layer'20087,239,002'Integrated circuit device'20077,053,326'Integrated type gas-insulated switching apparatus'20067,054,388'Signal detection method and apparatus, relevant program, and storage medium storing the program'20066,966,934'Gas reclaiming equipment'20056,826,350'High-speed signal search method device and recording medium for the same'20046,743,999'Integrated type gas-insulated switching apparatus'20046,630,409'Method of forming a polycide electrode in a semiconductor device'20036,538,224'Hybrid type gas insulation switch gear apparatus'20035,575,886'Method for fabricating semiconductor device with chemical-mechanical polishing process for planarization of interlayer insulation films'19965,502,007'Method of forming flat surface of insulator film of semiconductor device'19965,448,163'Meter drive including a timer for generating update cycles at a frequency larger than the input clock pulses and digital filtering'19955,446,655'Multiple-meter driving apparatus'19955,315,536'Meter driving system'19945,291,126'Pulse width modulation driving circuit for a cross coil meter'19945,218,291'Meter and meter driving system with indication fluctuation suppression and enhancement'19935,051,688'Crossed coil meter driving device having a plurality of input parameters'19914,440,194'Moving body and method of performing work within pipes with use of same'19844,424,402'Gas-insulated bushing'19844,397,890'Method of lining pipes'1983Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1991–1995Patents assigned to ROHM CO LTD (6)· patent assignee history
1991–1995Based in Kyoto, JP· patent location history
1996–2010Patents assigned to NEC CORP (7)· patent assignee history
1996–2021Based in Tokyo, JP· patent location history
2003–2010Patents assigned to NEC ELECTRONICS CORP (5)· patent assignee history
2003–2007Based in Kawasaki, JP· patent location history
2004–2010Patents assigned to NIPPON TELEGRAPH & TELEPHONE (6)· patent assignee history
2005–2010Based in Kanagawa, JP· patent location history
2010–2021Based in Nagoya, JP· patent location history
2014–2021Patents assigned to IIX INC (10)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IIX INC | 10 | 2014–2021 |
| NEC CORP | 7 | 1996–2010 |
| NIPPON TELEGRAPH & TELEPHONE | 6 | 2004–2010 |
| ROHM CO LTD | 6 | 1991–1995 |
| NEC ELECTRONICS CORP | 5 | 2003–2010 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 15 | 1996–2021 |
| Kyoto, JP | 6 | 1991–1995 |
| Kanagawa, JP | 5 | 2005–2010 |
| Nagoya, JP | 4 | 2010–2021 |
| Kawasaki, JP | 4 | 2003–2007 |