Inventor
Kyeong-Seon Shin
Inventor
Kyungki-do, KR
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables33%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1023%
G11CStatic stores17%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1013%
H10DInorganic electric semiconductor devices10%
B23KSoldering or unsoldering3%
PatentTitleYear
7,689,876'Real-time optimized testing of semiconductor device'20107,671,361'Semiconductor device including fuse focus detector, fabricating method thereof and laser repair method using the fuse focus detector'20107,633,288'Method of testing semiconductor devices and handler used for testing semiconductor devices'20097,602,172'Test apparatus having multiple head boards at one handler and its test method'20097,492,032'Fuse regions of a semiconductor memory device and methods of fabricating the same'20097,408,339'Test system of semiconductor device having a handler remote control and method of operating the same'20087,378,864'Test apparatus having multiple test sites at one handler and its test method'20087,230,417'Test system of semiconductor device having a handler remote control and method of operating the same'20076,972,612'Semiconductor device with malfunction control circuit and controlling method thereof'20056,960,908'Method for electrical testing of semiconductor package that detects socket defects in real time'20056,922,050'Method for testing a remnant batch of semiconductor devices'20056,903,567'Test apparatus having multiple test sites at one handler and its test method'20056,861,682'Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same'20056,850,450'Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2010Patents assigned to SAMSUNG ELECTRONICS CO LTD (14)· patent assignee history
2005–2009Based in Kyungki-do, KR· patent location history
2005–2008Based in Gyeonggi-do, KR· patent location history
2005Based in Euiwang, KR· patent location history
2005Based in Youngin, KR· patent location history
2009–2010Based in Yongin-si, KR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SAMSUNG ELECTRONICS CO LTD | 14 | 2005–2010 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kyungki-do, KR | 5 | 2005–2009 |
| Yongin-si, KR | 4 | 2009–2010 |
| Gyeonggi-do, KR | 3 | 2005–2008 |
| Euiwang, KR | 1 | 2005 |
| Youngin, KR | 1 | 2005 |