Inventor

Haruo Takeda

Inventor
Kawasaki, JP

Overview

34→
Patents
1986–2021
Patent span
Physics
Primary field (CPC G)

Patents· 34 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H04Nprimary
H04NPictorial communication, e.g. television18%
G06FElectric digital data processing17%
G06TImage data processing or generation, in general15%
G01NInvestigating or analysing materials by determining their chemical or physical properties12%
G06VImage or video recognition or understanding8%
G11BInformation storage based on relative movement between record carrier and transducer7%
G01GWeighing3%
G09GArrangements or circuits for control of indicating devices using static means to present variable information3%
H03MCoding3%
A63FCard, board, or roulette games2%
PatentTitleYear
11,043,779Terminal-equipped electric wire manufacturing apparatus and terminal-equipped electric wire20216,695,451'Multi-projection image display device'20046,205,862'Viscoelasticity measurement apparatus'20016,072,478'System for and method for producing and displaying images which are viewed from various viewpoints in local spaces'20006,057,516'Thermogravimetric instrument'20006,046,745'Three-dimensional model making device and its method'20006,041,082'Digital amplitude modulation amplifier and television broadcasting machine'20005,764,801'Decoding system and method of coded data by parallel processings'19985,343,560'Image data display system'19945,325,483'Image information retrieval network system'19945,306,087'Apparatus for thermogravimetry'19945,293,404'Thermal measuring and testing system having synchronized sample transporting means'19945,228,100'Method and system for producing from document image a form display with blank fields and a program to input data to the blank fields'19935,199,083'Image data processing method and system for giving identification labels to areas of connected black picture elements'19935,182,950'Tension type dynamic viscoelasticity measuring apparatus'19935,165,103'Image data processing method for selective partial image storage'19925,154,085'Tension type dynamic viscoelasticity measuring apparatus'19925,150,462'Image data display system'19925,140,647'Image joining method and system'19925,101,448'Method and apparatus for processing a document by utilizing an image'19925,047,868'Image data processing method for selective partial image display'19915,016,127'Mechanism for transporting and receiving large and small tape cassettes'19915,013,159'Thermal analysis apparatus'19914,992,954'Method of storing character patterns and character pattern utilization system'19914,985,930'Image data filing system and image data correcting method'19914,984,469'Amplitude measurement device for viscoelasticity analysis'19914,853,921'Method for storing data in rotary type recording media'19894,809,345'Method of and apparatus for enlarging/reducing two-dimensional images'19894,808,987'Image data file storage and retrieval system for an image data filing system'19894,760,526'Method for storing data into a file device and for data retrieval'19884,748,678'Method of storing and retrieving image data'19884,734,678'High-resolution A/D converter'19884,618,991'Processing method for the rotation of an image'19864,610,026'Method of and apparatus for enlarging/reducing two-dimensional images'1986

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1986–2004Patents assigned to HITACHI LTD (22)· patent assignee history
1986–1989Based in Machida, JP· patent location history
1988–2001Patents assigned to SEIKO INSTR INC (9)· patent assignee history
1988–2004Based in Kawasaki, JP· patent location history
1988–2000Based in Tokyo, JP· patent location history
1993Patents assigned to HITACHI SOFTWARE ENG (1)· patent assignee history
2000Patents assigned to JAPAN BROADCASTING CORP (1)· patent assignee history
2000Patents assigned to NEC CORP (1)· patent assignee history
2000–2001Based in Chiba, JP· patent location history
2021Based in Makinohara-shi, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI LTD221986–2004
SEIKO INSTR INC91988–2001
HITACHI SOFTWARE ENG11993
JAPAN BROADCASTING CORP12000
NEC CORP12000
Locations
LocationPatentsSpan
Kawasaki, JP171988–2004
Tokyo, JP81988–2000
Machida, JP31986–1989
Chiba, JP22000–2001
Makinohara-shi, JP12021